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Jorge Filipe Leal Costa Semião
AuthID:
R-001-F67
Publications
Confirmed
To Validate
Document Source:
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Document Type:
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Proceedings Paper (56)
Article (14)
Book Chapter (10)
Book (3)
Review (1)
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Results:
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Confirmed Publications: 84
41
TITLE:
Fault-Tolerance in FPGA Focusing Power Reduction or Performance Enhancement
AUTHORS:
Leong, C
;
Jorge Semião
;
Santos, MB
;
Teixeira, IC
;
Teixeira, JP
;
PUBLISHED:
2015
,
SOURCE:
16th IEEE Latin American Test Symposium (LATS)
in
2015 16TH LATIN-AMERICAN TEST SYMPOSIUM (LATS)
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
CIÊNCIAVITAE
42
TITLE:
Integration of a Food Distribution Routing Optimization Software with an Enterprise Resource Planner
AUTHORS:
Cardoso, PJS
;
Schütz, G
;
Jorge Semião
;
Monteiro, J
;
Rodrigues, J
;
Mazayev, A
; Ey, E; Viegas, M; Neves, C; Anastácio, S;
PUBLISHED:
2015
,
SOURCE:
1st International Conference on Geographical Information Systems Theory, Applications and Management (GISTAM)
in
2015 1ST INTERNATIONAL CONFERENCE ON GEOGRAPHICAL INFORMATION SYSTEMS THEORY, APPLICATIONS AND MANAGEMENT (GISTAM)
INDEXED IN:
Scopus
WOS
DBLP
CrossRef
43
TITLE:
A Distributed Load Scheduling Mechanism for Micro Grids
AUTHORS:
Monteiro, J
; Eduardo, J;
Cardoso, PJS
;
Jorge Semião
;
PUBLISHED:
2014
,
SOURCE:
2014 IEEE International Conference on Smart Grid Communications (SmartGridComm)
in
2014 IEEE INTERNATIONAL CONFERENCE ON SMART GRID COMMUNICATIONS (SMARTGRIDCOMM)
INDEXED IN:
Scopus
WOS
DBLP
CrossRef
:
8
44
TITLE:
Aging-aware dynamic voltage or frequency scaling
AUTHORS:
Jorge Semião
; Leong, C; Romao, A;
Santos, MB
;
Teixeira, IC
;
Teixeira, JP
;
PUBLISHED:
2014
,
SOURCE:
2014 29th Conference on Design of Circuits and Integrated Systems, DCIS 2014
in
Proceedings of the 2014 29th Conference on Design of Circuits and Integrated Systems, DCIS 2014
INDEXED IN:
Scopus
CrossRef
:
1
IN MY:
ORCID
|
CIÊNCIAVITAE
45
TITLE:
Performance sensor for tolerance and predictive detection of delay-faults
AUTHORS:
Jorge Semião
; Saraiva, D; Leong, C; Romao, A;
Santos, MB
;
Teixeira, IC
;
Teixeira, JP
;
PUBLISHED:
2014
,
SOURCE:
27th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014
in
Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
INDEXED IN:
Scopus
CrossRef
IN MY:
ORCID
|
CIÊNCIAVITAE
46
TITLE:
AGING MONITORING WITH LOCAL SENSORS IN FPGA-BASED DESIGNS
AUTHORS:
Leong, C
;
Jorge Semião
;
Teixeira, IC
;
Santos, MB
;
Teixeira, JP
; Valdes, M;
Freijedo, J
; Rodriguez Andina, JJ;
Vargas, F
;
PUBLISHED:
2013
,
SOURCE:
23rd International Conference on Field Programmable Logic and Applications (FPL)
in
2013 23RD INTERNATIONAL CONFERENCE ON FIELD PROGRAMMABLE LOGIC AND APPLICATIONS (FPL 2013) PROCEEDINGS
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
CIÊNCIAVITAE
47
TITLE:
Design and Validation of Configurable Online Aging Sensors in Nanometer-Scale FPGAs
AUTHORS:
Maria D Valdes Pena;
Judit F Fernandez Freijedo
; Maria J M Moure Rodriguez; Juan J Rodriguez Andina;
Jorge Semião
;
Isabel Maria C Cacho Teixeira
;
Joao Paulo C Cacho Teixeira
;
Fabian Vargas
;
PUBLISHED:
2013
,
SOURCE:
IEEE TRANSACTIONS ON NANOTECHNOLOGY,
VOLUME:
12,
ISSUE:
4
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
|
CIÊNCIAVITAE
48
TITLE:
Process Variations-Aware Statistical Analysis Framework for Aging Sensors Insertion
Full Text
AUTHORS:
Vazquez, JC; Champac, V;
Jorge Semião
;
Teixeira, IC
;
Santos, MB
;
Teixeira, JP
;
PUBLISHED:
2013
,
SOURCE:
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS,
VOLUME:
29,
ISSUE:
3
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
|
CIÊNCIAVITAE
49
TITLE:
Aging-Aware Power or Frequency Tuning With Predictive Fault Detection
Full Text
AUTHORS:
Jackson Pachito
;
Celestino V Martins
; Bruno Jacinto;
Isabel C Teixeira
;
Joao Paulo Teixeira
;
Jorge Semião
; Julio C Vazquez; Victor Champac;
Marcelino B Santos
;
PUBLISHED:
2012
,
SOURCE:
IEEE DESIGN & TEST OF COMPUTERS,
VOLUME:
29,
ISSUE:
5
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
|
CIÊNCIAVITAE
50
TITLE:
Modeling the Effect of Process, Power-Supply Voltage and Temperature Variations on the Timing Response of Nanometer Digital Circuits
Full Text
AUTHORS:
Judit F Freijedo
;
Jorge Semião
; Juan J Rodriguez Andina;
Fabian Vargas
;
Isabel C Teixeira
;
Paulo Teixeira, JP
;
PUBLISHED:
2012
,
SOURCE:
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS,
VOLUME:
28,
ISSUE:
4
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
|
CIÊNCIAVITAE
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