41
TITLE: Fault-Tolerance in FPGA Focusing Power Reduction or Performance Enhancement
AUTHORS: Leong, C; Jorge Semião ; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2015, SOURCE: 16th IEEE Latin American Test Symposium (LATS) in 2015 16TH LATIN-AMERICAN TEST SYMPOSIUM (LATS)
INDEXED IN: Scopus WOS CrossRef
42
TITLE: Integration of a Food Distribution Routing Optimization Software with an Enterprise Resource Planner
AUTHORS: Cardoso, PJS ; Schütz, G ; Jorge Semião ; Monteiro, J ; Rodrigues, J ; Mazayev, A ; Ey, E; Viegas, M; Neves, C; Anastácio, S;
PUBLISHED: 2015, SOURCE: 1st International Conference on Geographical Information Systems Theory, Applications and Management (GISTAM) in 2015 1ST INTERNATIONAL CONFERENCE ON GEOGRAPHICAL INFORMATION SYSTEMS THEORY, APPLICATIONS AND MANAGEMENT (GISTAM)
INDEXED IN: Scopus WOS DBLP CrossRef
43
TITLE: A Distributed Load Scheduling Mechanism for Micro Grids
AUTHORS: Monteiro, J ; Eduardo, J; Cardoso, PJS ; Jorge Semião ;
PUBLISHED: 2014, SOURCE: 2014 IEEE International Conference on Smart Grid Communications (SmartGridComm) in 2014 IEEE INTERNATIONAL CONFERENCE ON SMART GRID COMMUNICATIONS (SMARTGRIDCOMM)
INDEXED IN: Scopus WOS DBLP CrossRef: 8
44
TITLE: Aging-aware dynamic voltage or frequency scaling
AUTHORS: Jorge Semião ; Leong, C; Romao, A; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2014, SOURCE: 2014 29th Conference on Design of Circuits and Integrated Systems, DCIS 2014 in Proceedings of the 2014 29th Conference on Design of Circuits and Integrated Systems, DCIS 2014
INDEXED IN: Scopus CrossRef: 1
45
TITLE: Performance sensor for tolerance and predictive detection of delay-faults
AUTHORS: Jorge Semião ; Saraiva, D; Leong, C; Romao, A; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2014, SOURCE: 27th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014 in Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
INDEXED IN: Scopus CrossRef
46
TITLE: AGING MONITORING WITH LOCAL SENSORS IN FPGA-BASED DESIGNS
AUTHORS: Leong, C; Jorge Semião ; Teixeira, IC; Santos, MB; Teixeira, JP; Valdes, M; Freijedo, J; Rodriguez Andina, JJ; Vargas, F;
PUBLISHED: 2013, SOURCE: 23rd International Conference on Field Programmable Logic and Applications (FPL) in 2013 23RD INTERNATIONAL CONFERENCE ON FIELD PROGRAMMABLE LOGIC AND APPLICATIONS (FPL 2013) PROCEEDINGS
INDEXED IN: Scopus WOS CrossRef
47
TITLE: Design and Validation of Configurable Online Aging Sensors in Nanometer-Scale FPGAs
AUTHORS: Maria D Valdes Pena; Judit F Fernandez Freijedo; Maria J M Moure Rodriguez; Juan J Rodriguez Andina; Jorge Semião ; Isabel Maria C Cacho Teixeira ; Joao Paulo C Cacho Teixeira ; Fabian Vargas;
PUBLISHED: 2013, SOURCE: IEEE TRANSACTIONS ON NANOTECHNOLOGY, VOLUME: 12, ISSUE: 4
INDEXED IN: Scopus WOS CrossRef
48
TITLE: Process Variations-Aware Statistical Analysis Framework for Aging Sensors Insertion  Full Text
AUTHORS: Vazquez, JC; Champac, V; Jorge Semião ; Teixeira, IC ; Santos, MB ; Teixeira, JP ;
PUBLISHED: 2013, SOURCE: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, VOLUME: 29, ISSUE: 3
INDEXED IN: Scopus WOS CrossRef
49
TITLE: Aging-Aware Power or Frequency Tuning With Predictive Fault Detection  Full Text
AUTHORS: Jackson Pachito; Celestino V Martins; Bruno Jacinto; Isabel C Teixeira ; Joao Paulo Teixeira ; Jorge Semião ; Julio C Vazquez; Victor Champac; Marcelino B Santos ;
PUBLISHED: 2012, SOURCE: IEEE DESIGN & TEST OF COMPUTERS, VOLUME: 29, ISSUE: 5
INDEXED IN: Scopus WOS CrossRef
50
TITLE: Modeling the Effect of Process, Power-Supply Voltage and Temperature Variations on the Timing Response of Nanometer Digital Circuits  Full Text
AUTHORS: Judit F Freijedo; Jorge Semião ; Juan J Rodriguez Andina; Fabian Vargas; Isabel C Teixeira ; Paulo Teixeira, JP ;
PUBLISHED: 2012, SOURCE: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, VOLUME: 28, ISSUE: 4
INDEXED IN: Scopus WOS CrossRef
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