Performance Sensor for Tolerance and Predictive Detection of Delay-Faults

AuthID
 P-00A-0PC
7
Author(s)
Saraiva, D
·
Leong, C
·
Romao, A
·
Document Type
Proceedings Paper
Year published
2014
Published
in Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, ISSN: 1550-5774
Pages: 110-115
Conference
27Th Ieee International Symposium on Defect and Fault Tolerance in Vlsi and Nanotechnology Systems, Dft 2014, Date: 1 October 2014 through 3 October 2014, Sponsors: IEEE Computer Society;IEEE Fault-Tolerant Computing Technical Committee;IEEE Test Technology Technical Council (TTTC)
Indexing
Scopus®
Crossref®
Google Scholar®
Publication Identifiers
Scopus: 2-s2.0-84914674755
Source Identifiers
ISSN: 1550-5774
Export Publication Metadata
Marked List
 Add to Marked List
Citations
Oops! It looks like you don't have access to this content.

This section is restricted to uses with b-on access.

CORE Conference
No information about CORE Rank

During the preprocessing phase, only publications of type 'Proceedings Paper' or 'Proceedings' are automatically processed to identify their CORE Rank.

TIP: If your publication's CORE Rank is missing, you can contact with your institutional manager to have the correct ranking manually added to the record.

Journal Factors
Oops! It looks like you don't have access to this content.

This section is restricted to uses with b-on access.

Info
At this moment we don't have any links to full text documens.

footer slogan

Useful Links

Get Help

© 2026 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service