51
TITLE: The Influence of Clock-Gating On NBTI-Induced Delay Degradation
AUTHORS: Pachito, J; Martins, CV; Jorge Semião ; Santos, M ; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2012, SOURCE: IEEE 18th International On-Line Testing Symposium (IOLTS) in 2012 IEEE 18TH INTERNATIONAL ON-LINE TESTING SYMPOSIUM (IOLTS)
INDEXED IN: Scopus WOS CrossRef
52
TITLE: Adaptive Error-Prediction Flip-flop for Performance Failure Prediction with Aging Sensors
AUTHORS: Martins, CV; Jorge Semião ; Vazquez, JC; Champac, V; Santos, M ; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2011, SOURCE: 29th IEEE VLSI Test Symposium (VTS)/Workshop on Design for Reliability and Variability (DRV) in 2011 IEEE 29TH VLSI TEST SYMPOSIUM (VTS)
INDEXED IN: Scopus WOS CrossRef
53
TITLE: IP core to leverage RTOS-based embedded systems reliability to electromagnetic interference
AUTHORS: Silva, D; Poehls, LB; Jorge Semião ; Teixeira, IC ; Teixeira, JP ; Valdes, M; Freijedo, J; Rodriguez Andina, JJ; Vargas, F;
PUBLISHED: 2011, SOURCE: 8th International Workshop on Electromagnetic Compatibility of Integrated Circuits, EMC COMPO 2011 in Proceedings of the 8th International Workshop on Electromagnetic Compatibility of Integrated Circuits 2011, EMC COMPO 2011
INDEXED IN: Scopus
54
TITLE: Lower V DD operation of FPGA-based digital circuits through delay modeling and time borrowing
AUTHORS: Freijedo, J; Valdes, MD; Costas, L; Moure, MJ; Rodriguez Andina, JJ; Jorge Semião ; Vargas, F; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2011, SOURCE: Journal of Low Power Electronics, VOLUME: 7, ISSUE: 2
INDEXED IN: Scopus CrossRef
55
TITLE: Modeling the effect of process variations on the timing response of nanometer digital circuits
AUTHORS: Freijedo, J; Jorge Semião ; Rodriguez Andina, JJ; Vargas, F; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2011, SOURCE: 12th IEEE Latin-American Test Workshop, LATW 2011 in LATW 2011 - 12th IEEE Latin-American Test Workshop
INDEXED IN: Scopus CrossRef
56
TITLE: On-line BIST for performance failure prediction under aging effects in automotive safety-critical applications
AUTHORS: Oliveira, RS; Jorge Semião ; Teixeira, IC ; Santos, MB ; Teixeira, JP ;
PUBLISHED: 2011, SOURCE: 12th IEEE Latin-American Test Workshop, LATW 2011 in LATW 2011 - 12th IEEE Latin-American Test Workshop
INDEXED IN: Scopus CrossRef
57
TITLE: On-line BIST for performance failure prediction under NBTI-induced aging in safety-critical applications
AUTHORS: Oliveira, RS; Jorge Semião ; Teixeira, IC ; Santos, MB ; Teixeira, JP ;
PUBLISHED: 2011, SOURCE: Journal of Low Power Electronics, VOLUME: 7, ISSUE: 4
INDEXED IN: Scopus CrossRef
58
TITLE: Performance failure prediction using built-in delay sensors in FPGAs
AUTHORS: Bexiga, V; Leong, C; Jorge Semião ; Ic Teixeira ; Teixeira, JP ; Valdes, M; Freijedo, J; Rodriguez Andina, JJ; Vargas, F;
PUBLISHED: 2011, SOURCE: 21st International Conference on Field Programmable Logic and Applications, FPL 2011 in Proceedings - 21st International Conference on Field Programmable Logic and Applications, FPL 2011
INDEXED IN: Scopus CrossRef
59
TITLE: Programmable sensor for on-line checking of signal integrity in FPGA-based systems subject to aging effects
AUTHORS: Valdes, M; Freijedo, J; Moure, MJ; Rodriguez Andina, JJ; Jorge Semião ; Vargas, F; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2011, SOURCE: 12th IEEE Latin-American Test Workshop, LATW 2011 in LATW 2011 - 12th IEEE Latin-American Test Workshop
INDEXED IN: Scopus CrossRef
60
TITLE: Delay modeling for power noise-aware design in Spartan-3A FPGAS
AUTHORS: Freijedo, JF; Valdes, MD; Moure, MJ; Costas, L; Rodriguez Andina, JJ; Jorge Semião ; Vargas, F; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2010, SOURCE: 6th Southern Programmable Logic Conference, SPL 2010 in 6th Southern Programmable Logic Conference, SPL 2010 - Proceedings
INDEXED IN: Scopus CrossRef
Page 6 of 9. Total results: 84.