Modeling the Effect of Process Variations on the Timing Response of Nanometer Digital Circuits

AuthID
 P-008-07Y
6
Author(s)
Rodriguez Andina, JJ
·
Document Type
Proceedings Paper
Year published
2011
Published
in LATW 2011 - 12th IEEE Latin-American Test Workshop
Conference
12Th Ieee Latin-American Test Workshop, Latw 2011, Date: 27 March 2011 through 30 March 2011, Location: Porto de Galinhas, Sponsors: SBU;CNPq;freescale
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Scopus: 2-s2.0-80052617161
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