Henrique Leonel Gomes


AuthID: R-000-5XR

Confirmed Publications: 86



41
TITLE: Metal contacts in thin-film transistors  Full Text
AUTHORS: Stallinga, P ; Gomes, HL ;
PUBLISHED: 2007, SOURCE: ORGANIC ELECTRONICS, VOLUME: 8, ISSUE: 4
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
42
TITLE: Reproducible resistive switching in nonvolatile organic memories  Full Text
AUTHORS: Frank Verbakel; Stefan C J Meskers; Rene A J Janssen; Henrique L Gomes ; Michael Coelle; Michael Buechel; Dago M de Leeuw;
PUBLISHED: 2007, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 91, ISSUE: 19
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
43
TITLE: Voltage- and light-induced hysteresis effects at the high-k dielectric- poly(3-hexylthiophene) interface  Full Text
AUTHORS: Lancaster, J; Taylor, DM; Sayers, P; Gomes, HL ;
PUBLISHED: 2007, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 90, ISSUE: 10
INDEXED IN: Scopus WOS CrossRef
44
TITLE: Electrical instabilities in organic semiconductors caused by trapped supercooled water  Full Text
AUTHORS: Gomes, HL ; Stallinga, P ; Colle, M; de Leeuw, DM; Biscarini, F;
PUBLISHED: 2006, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 88, ISSUE: 8
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
45
TITLE: Light-emitting thin-film field-effect transistors
AUTHORS: Peter Stallinga ; Henrique L Gomes ;
PUBLISHED: 2006, SOURCE: OPTICA APPLICATA, VOLUME: 36, ISSUE: 2-3
INDEXED IN: Scopus WOS
IN MY: ORCID
46
TITLE: Modeling electrical characteristics of thin-film field-effect transistors I. Trap-free materials  Full Text
AUTHORS: Stallinga, P ; Gomes, HL ;
PUBLISHED: 2006, SOURCE: SYNTHETIC METALS, VOLUME: 156, ISSUE: 21-24
INDEXED IN: Scopus WOS
IN MY: ORCID
47
TITLE: Modeling electrical characteristics of thin-film field-effect transistors II: Effects of traps and impurities  Full Text
AUTHORS: Stallinga, P ; Gomes, HL ;
PUBLISHED: 2006, SOURCE: SYNTHETIC METALS, VOLUME: 156, ISSUE: 21-24
INDEXED IN: Scopus WOS
IN MY: ORCID
48
TITLE: Organic materials for active layers in transistors: Study of the electrical stability properties
AUTHORS: Gomes, HL ; Stallinga, P ; de Leeuw, DM;
PUBLISHED: 2006, SOURCE: 3rd International Materials Symposium/12th Meeting of the Sociedad-Portuguesa-da-Materials (Materials 2005/SPM) in ADVANCED MATERIALS FORUM III, PTS 1 AND 2, VOLUME: 514-516, ISSUE: PART 1
INDEXED IN: Scopus WOS
IN MY: ORCID
49
TITLE: The effect of water related traps on the reliability of organic based transistors  Full Text
AUTHORS: Gomes, HL ; Stallinga, P ; Colle, M; Biscarini, F; de Leeuw, DM;
PUBLISHED: 2006, SOURCE: 21st International Conference on Amorphous and Nanocrystalline Semiconductors in JOURNAL OF NON-CRYSTALLINE SOLIDS, VOLUME: 352, ISSUE: 9-20
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
50
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