21
TITLE: Room temperature thin foil SLIM-cut using an epoxy paste: experimental versus theoretical results
AUTHORS: Pierre Bellanger; Pierre Olivier Bouchard; Marc Bernacki; Joao Serra ;
PUBLISHED: 2015, SOURCE: MATERIALS RESEARCH EXPRESS, VOLUME: 2, ISSUE: 4
INDEXED IN: Scopus WOS CrossRef
22
TITLE: New Stress Activation Method for Kerfless Silicon Wafering Using Ag/Al and Epoxy Stress-Inducing Layers  Full Text
AUTHORS: Pierre Bellanger; Miguel Centeno Brito ; David M Pera; Ivo Costa; Guilherme Gaspar; Roberto Martini; Marteen Debucquoy; Joao M Serra ;
PUBLISHED: 2014, SOURCE: IEEE JOURNAL OF PHOTOVOLTAICS, VOLUME: 4, ISSUE: 5
INDEXED IN: Scopus WOS CrossRef
23
TITLE: Room temperature kerfless silicon thin foils obtained via a stress inducing epoxy layer. Room temperature kerfless silicon thin foils obtained via a stress inducing epoxy layer  Full Text
AUTHORS: Joao Serra ; Pierre Bellanger; Pierre O Bouchard; Marc Bernacki;
PUBLISHED: 2014, SOURCE: European-Materials-Research-Society Spring Meeting / Symposium X on Materials Research for Group IV Semiconductors - Growth, Characterization, and Technological Developments in PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 11, NO 11-12, VOLUME: 11, ISSUE: 11-12
INDEXED IN: Scopus WOS CrossRef
24
TITLE: Room temperature spalling of thin silicon foils using a kerfless technique
AUTHORS: Pierre Bellanger; Joao Serra ;
PUBLISHED: 2014, SOURCE: 4th International Conference on Crystalline Silicon Photovoltaics (SiliconPV) in PROCEEDINGS OF THE 4TH INTERNATIONAL CONFERENCE ON CRYSTALLINE SILICON PHOTOVOLTAICS (SILICONPV 2014), VOLUME: 55
INDEXED IN: Scopus WOS CrossRef
25
TITLE: Silicon film deposition on crystalline, sintered and powder substrates using an inline optical processing CVD system. Silicon film deposition on crystalline, sintered and powder substrates using an inline optical processing CVD system  Full Text
AUTHORS: Andre Augusto; Filipe Serra; Antonio Vallera; Joao M Serra ;
PUBLISHED: 2014, SOURCE: European-Materials-Research-Society Spring Meeting / Symposium X on Materials Research for Group IV Semiconductors - Growth, Characterization, and Technological Developments in PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 11, NO 11-12, VOLUME: 11, ISSUE: 11-12
INDEXED IN: Scopus WOS CrossRef
26
TITLE: Comparative Study of Stress Inducing Layers to Produce Kerfless Thin Wafers by the Slim-cut Technique  Full Text
AUTHORS: Serra, JM ; Bellanger, P; Lobato, K; Martini, R; Debucquoy, M; Poortmans, J;
PUBLISHED: 2013, SOURCE: 39th IEEE Photovoltaic Specialists Conference (PVSC) in 2013 IEEE 39TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC)
INDEXED IN: Scopus WOS CrossRef
27
TITLE: Electric molten zone crystallization of silicon wafers  Full Text
AUTHORS: Costa, I; Brito, MC ; Gaspar, G; Serra, JM ; Maia M Alves ; Vallera, A;
PUBLISHED: 2013, SOURCE: SEMICONDUCTOR SCIENCE AND TECHNOLOGY, VOLUME: 28, ISSUE: 12
INDEXED IN: Scopus WOS CrossRef
28
TITLE: Measurement of the dopant concentration in a semiconductor using the Seebeck effect  Full Text
AUTHORS: Pó, JM; Brito, MC ; Maia M Alves ; Silva, JA; Serra, JM ; Vallêra, AM;
PUBLISHED: 2013, SOURCE: Measurement Science and Technology - Meas. Sci. Technol., VOLUME: 24, ISSUE: 5
INDEXED IN: CrossRef
29
TITLE: Measurement of the dopant concentration in a semiconductor using the Seebeck effect  Full Text
AUTHORS: Po, JM; Brito, MC ; Maia Alves, JM ; Silva, JA ; Serra, JM ; Vallera, AM;
PUBLISHED: 2013, SOURCE: MEASUREMENT SCIENCE & TECHNOLOGY, VOLUME: 24, ISSUE: 5
INDEXED IN: Scopus WOS
30
TITLE: Residual stress and dislocations density in silicon ribbons grown via optical zone melting  Full Text
AUTHORS: Augusto, A; Pera, D; Choi, HJ; Bellanger, P; Brito, MC ; Maia Alves, JM ; Vallera, AM; Buonassisi, T; Serra, JM ;
PUBLISHED: 2013, SOURCE: JOURNAL OF APPLIED PHYSICS, VOLUME: 113, ISSUE: 8
INDEXED IN: Scopus WOS CrossRef
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