José Filipe Vilela Vaz


AuthID: R-000-8B4

Confirmed Publications: 133



61
TITLE: Thickness Control of Coatings by Means of Modulated IR Radiometry  Full Text
AUTHORS: Francisco Macedo ; Filipe Vaz ; Ana C Fernandes; Jean Nzodoum N Fotsing; Juergen Gibkes; Josef Pelzl; Bruno K Bein;
PUBLISHED: 2009, SOURCE: 11th International Conference on Plasma Surface Engineering in PLASMA PROCESSES AND POLYMERS, VOLUME: 6, ISSUE: SUPPL. 1
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
62
TITLE: ZrOxNy decorative thin films prepared by the reactive gas pulsing process  Full Text
AUTHORS: Pedro Carvalho; Luis Cunha ; Eduardo Alves ; Nicolas Martin; Eric Le Bourhis; Filipe Vaz ;
PUBLISHED: 2009, SOURCE: JOURNAL OF PHYSICS D-APPLIED PHYSICS, VOLUME: 42, ISSUE: 19
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
63
TITLE: Development of dark Ti(C,O,N) coatings prepared by reactive sputtering  Full Text
AUTHORS: Chappe, JM; Vaz, F ; Cunha, L ; Moura, C ; Marco C M De Lucas; Imhoff, L; Bourgeois, S; Pierson, JF;
PUBLISHED: 2008, SOURCE: 35th International Conference on Metallurgical Coatings and Thin Films in SURFACE & COATINGS TECHNOLOGY, VOLUME: 203, ISSUE: 5-7
INDEXED IN: Scopus WOS
IN MY: ORCID
64
TITLE: Effect of the microstructure on the cutting performance of superhard (Ti,Si,Al)N nanocomposite films  Full Text
AUTHORS: Fernandes, C; Carvalho, S ; Rebouta, L ; Vaz, F ; Denannot, MF; Pacaud, J; Riviere, JP; Cavaleiro, A ;
PUBLISHED: 2008, SOURCE: 5th Iberian Vacuum Meeting in VACUUM, VOLUME: 82, ISSUE: 12
INDEXED IN: Scopus WOS CrossRef: 7
IN MY: ORCID
65
TITLE: Effect of thermal treatments on the structure of MoNxOy thin films  Full Text
AUTHORS: Cunha, L ; Rebouta, L ; Vaz, F ; Staszuk, M; Malara, S; Barbosa, J; Carvalho, P; Alves, E ; Le Bourhis, E; Ph. Goudeau; Riviere, JP;
PUBLISHED: 2008, SOURCE: 5th Iberian Vacuum Meeting in VACUUM, VOLUME: 82, ISSUE: 12
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
66
TITLE: Influence of air oxidation on the properties of decorative NbOxNy coatings prepared by reactive gas pulsing  Full Text
AUTHORS: Chappe, JM; Carvalho, P; Lanceros Mendez, S ; Vasilevskiy, MI ; Vaz, F ; Machado, AV ; Fenker, M; Kappl, H; Parreira, NMG; Cavaleiro, A ; Alves, E ;
PUBLISHED: 2008, SOURCE: Meeting of the European-Materials-Research-Society in SURFACE & COATINGS TECHNOLOGY, VOLUME: 202, ISSUE: 11
INDEXED IN: Scopus WOS
IN MY: ORCID
67
TITLE: Influence of the chemical and electronic structure on the electrical behavior of zirconium oxynitride films  Full Text
AUTHORS: Carvalho, P; Chappe, JM; Cunha, L ; Lanceros Mendez, S; Alpuim, P ; Vaz, F ; Alves, E ; Rousselot, C; Espinos, JP; Gonzalez Elipe, AR;
PUBLISHED: 2008, SOURCE: JOURNAL OF APPLIED PHYSICS, VOLUME: 103, ISSUE: 10
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
68
TITLE: Modulated IR radiometry of (TiSi)N thin films  Full Text
AUTHORS: Macedo, F ; Vaz, F ; Rebouta, L ; Carvalho, P; Haj Daoud, A; Junge, KH; Pelzl, J; Bein, BK;
PUBLISHED: 2008, SOURCE: 5th Iberian Vacuum Meeting in VACUUM, VOLUME: 82, ISSUE: 12
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
69
TITLE: Photothermal characterization of thin films and coatings  Full Text
AUTHORS: Macedo, F ; Goeren, A; Vaz, F ; Nzodoum L N Fotsing; Gibkes, J; Bein, BK;
PUBLISHED: 2008, SOURCE: 5th Iberian Vacuum Meeting in VACUUM, VOLUME: 82, ISSUE: 12
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
70
TITLE: Researches on the dependence between processing conditions and some tribological properties of TI-SI-C thin films
AUTHORS: Daniel Munteanu; Vaz, F ; Lopes, C; Carvalho, S ; Ana Veteleanu; Borcea, B; Ionescu, C; Munteanu, A;
PUBLISHED: 2008, SOURCE: METALURGIA INTERNATIONAL, VOLUME: 13, ISSUE: 2
INDEXED IN: Scopus WOS
IN MY: ORCID
Page 7 of 14. Total results: 133.

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