81
TITLE: The formation, dissociation and electrical activity of divacancy-oxygen complexes in Si  Full Text
AUTHORS: Coutinho, J ; Jones, R; Oberg, S; Briddon, PR;
PUBLISHED: 2003, SOURCE: 22nd International Conference on Defects in Semiconductors (ICDS-22) in PHYSICA B-CONDENSED MATTER, VOLUME: 340
INDEXED IN: Scopus WOS CrossRef: 12
82
TITLE: Interaction between oxygen and single self-interstitials in silicon  Full Text
AUTHORS: Pinho, N; Coutinho, J ; Jones, R; Briddon, PR;
PUBLISHED: 2003, SOURCE: 22nd International Conference on Defects in Semiconductors (ICDS-22) in PHYSICA B-CONDENSED MATTER, VOLUME: 340
INDEXED IN: Scopus WOS CrossRef: 5
83
TITLE: Ab initio modeling of Be-H and Zn-H complexes in Si  Full Text
AUTHORS: Coutinho, J ; Torres, VJB ; Briddon, PR;
PUBLISHED: 2003, SOURCE: 22nd International Conference on Defects in Semiconductors (ICDS-22) in PHYSICA B-CONDENSED MATTER, VOLUME: 340
INDEXED IN: Scopus WOS CrossRef: 2
84
TITLE: Electronic properties of vacancy-oxygen complexes in SiGe alloys  Full Text
AUTHORS: Markevich, VP; Peaker, AR; Murin, LI; Coutinho, J ; Torres, VJB ; Jones, R; Oberg, S; Briddon, PR; Auret, FD; Abrosimov, NV;
PUBLISHED: 2003, SOURCE: 22nd International Conference on Defects in Semiconductors (ICDS-22) in PHYSICA B-CONDENSED MATTER, VOLUME: 340
INDEXED IN: Scopus WOS CrossRef: 2
85
TITLE: Effect of stress on the energy levels of the vacancy-oxygen-hydrogen complex in Si
AUTHORS: Coutinho, J ; Andersen, O; Dobaczewski, L; Nielsen, KB; Peaker, AR; Jones, R; Oberg, S; Briddon, PR;
PUBLISHED: 2003, SOURCE: PHYSICAL REVIEW B, VOLUME: 68, ISSUE: 18
INDEXED IN: Scopus WOS CrossRef: 20
86
TITLE: Electronic structure of divacancy-hydrogen complexes in silicon  Full Text
AUTHORS: Coutinho, J ; Torres, VJB ; Jones, R; Oberg, S; Briddon, PR;
PUBLISHED: 2003, SOURCE: Workshop on the Physics of Group IV Materials in JOURNAL OF PHYSICS-CONDENSED MATTER, VOLUME: 15, ISSUE: 39
INDEXED IN: Scopus WOS CrossRef: 8
87
TITLE: Vibrational modes of sulfur defects in GaP
AUTHORS: Leigh, RS; Sangster, MJL; Newman, RC; Goss, JP; Jones, R; Torres, VJB ; Oberg, S; Briddon, PR;
PUBLISHED: 2003, SOURCE: PHYSICAL REVIEW B, VOLUME: 68, ISSUE: 3
INDEXED IN: Scopus WOS CrossRef: 1
88
TITLE: Electrical activity of chalcogen-hydrogen defects in silicon
AUTHORS: Coutinho, J ; Torres, VJB ; Jones, R; Briddon, PR;
PUBLISHED: 2003, SOURCE: PHYSICAL REVIEW B, VOLUME: 67, ISSUE: 3
INDEXED IN: Scopus WOS CrossRef: 72
89
TITLE: Interstitial carbon-oxygen center and hydrogen related shallow thermal donors in Si
AUTHORS: Coutinho, J ; Jones, R; Briddon, PR; Oberg, S; Murin, LI; Markevich, VP; Lindstrom, JL;
PUBLISHED: 2002, SOURCE: Physical Review B - Condensed Matter and Materials Physics, VOLUME: 65, ISSUE: 1
INDEXED IN: Scopus
90
TITLE: Mg-H and Be-H complexes in cubic boron nitride
AUTHORS: Pinho, NMC; Torres, VJB ; Jones, R; Briddon, PR; Oberg, S;
PUBLISHED: 2001, SOURCE: Conference on Doping Issues in Wide Band-Gap Semiconductors in JOURNAL OF PHYSICS-CONDENSED MATTER, VOLUME: 13, ISSUE: 40
INDEXED IN: Scopus WOS CrossRef: 2
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