1
TITLE: Combined grazing incidence RBS and TEM analysis of luminescent nano-SiGe/SiO2 multilayers  Full Text
AUTHORS: Kling, A ; Rodriguez, A; Sangrador, J; Ortiz, MI; Rodriguez, T; Ballesteros, C; Soares, JC ;
PUBLISHED: 2008, SOURCE: 18th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 266, ISSUE: 8
INDEXED IN: Scopus WOS CrossRef
2
TITLE: Nanostructures with Group IV Nanocrystals Obtained by LPCVD and Thermal Annealing of SiGeO Layers
AUTHORS: Bruno Morana; Andres Rodriguez; Jesus Sangrador; Tomas Rodriguez; Oscar Martinez; Juan Jimenez; Andreas Kling ;
PUBLISHED: 2008, SOURCE: Symposium on Amorphous and Polycrystalline Thin-Film Silicon Science and Technology held at the 2008 MRS Spring Meeting in AMORPHOUS AND POLYCRYSTALLINE THIN-FILM SILICON SCIENCE AND TECHNOLOGY-2008, VOLUME: 1066
INDEXED IN: Scopus WOS
3
TITLE: Luminescence in multilayers of SiGe nanocrystals embedded in SiO2
AUTHORS: Manuel Avella; Angel Carmelo Prieto; Juan Jimenez; Andres Rodriguez; Jesus Sangrador; Tomas Rodriguez; Maria Isabel Ortiz; Carmen Ballesteros; Andreas Kling ;
PUBLISHED: 2007, SOURCE: Symposium on Group 4 Semiconductor Nanostructures held at the 2006 MRS Fall Meeting in Group IV Semiconductor Nanostructures-2006, VOLUME: 958
INDEXED IN: Scopus WOS
4
TITLE: Combined RBS and TEM characterization of nano-SiGe layers embedded in SiO2  Full Text
AUTHORS: Kling, A ; Ortiz, MI; Sangrador, J; Rodriguez, A; Rodriguez, T; BallesteroS, C; Soares, JC ;
PUBLISHED: 2006, SOURCE: 17th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 249, ISSUE: 1-2 SPEC. ISS.
INDEXED IN: Scopus WOS CrossRef
5
TITLE: Growth by LPCVD, crystallization and characterization of SiGe nanoparticles for nanoelectronic devices  Full Text
AUTHORS: Ortiz, MI; Sangrador, J; Rodriguez, A; Rodriguez, T; Kling, A ; Franc, N; Barradas, NP ; Ballesteros, C;
PUBLISHED: 2006, SOURCE: International Conference on Trends in Nanotechnology in PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, VOLUME: 203, ISSUE: 6
INDEXED IN: Scopus WOS CrossRef
6
TITLE: Ion beam analysis of the dry thermal oxidation of thin polycrystalline SiGe films  Full Text
AUTHORS: Kling, A ; Soares, JC ; Prieto, AC; Jimenez, J; Rodriguez, A; Sangrador, J; Rodriguez, T;
PUBLISHED: 2005, SOURCE: 8th European Conference on Accelerators in Applied Research and Technology in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 240, ISSUE: 1-2
INDEXED IN: Scopus WOS CrossRef
7
TITLE: Solid-phase crystallization of amorphous SiGe films deposited by LPCVD on SiO2 and glass  Full Text
AUTHORS: Olivares, J; Rodriguez, A; Sangrador, J; Rodriguez, T; Ballesteros, C; Kling, A ;
PUBLISHED: 1999, SOURCE: THIN SOLID FILMS, VOLUME: 337, ISSUE: 1-2
INDEXED IN: Scopus WOS CrossRef