Henrique Jorge Oliveira Fontes Quaresma
AuthID: R-000-5XB
1
TITLE: An equivalent doping profile for CMOS substrate characterization Full Text
AUTHORS: Henrique J Quaresma; Mendonca dos Santos, PM ; Cruz Serra, AC ;
PUBLISHED: 2013, SOURCE: SOLID-STATE ELECTRONICS, VOLUME: 79
AUTHORS: Henrique J Quaresma; Mendonca dos Santos, PM ; Cruz Serra, AC ;
PUBLISHED: 2013, SOURCE: SOLID-STATE ELECTRONICS, VOLUME: 79
2
TITLE: Impact of temperature on substrate coupling in low-doped substrate Full Text
AUTHORS: Quaresma, HJ; dos Santos, PM ; Serra, AC ;
PUBLISHED: 2011, SOURCE: ELECTRONICS LETTERS, VOLUME: 47, ISSUE: 23
AUTHORS: Quaresma, HJ; dos Santos, PM ; Serra, AC ;
PUBLISHED: 2011, SOURCE: ELECTRONICS LETTERS, VOLUME: 47, ISSUE: 23
3
TITLE: Substrate noise analysis for integrated circuits design
AUTHORS: Quaresma, HJ; Antonio Cruz Serra ;
PUBLISHED: 2007, SOURCE: 24th IEEE Instrumentation and Measurement Technology Conference in 2007 IEEE INSTRUMENTATION & MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5
AUTHORS: Quaresma, HJ; Antonio Cruz Serra ;
PUBLISHED: 2007, SOURCE: 24th IEEE Instrumentation and Measurement Technology Conference in 2007 IEEE INSTRUMENTATION & MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5
INDEXED IN: 
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Scopus WOS4
TITLE: A methodology for extracting unknown integrated circuit process parameters
AUTHORS: Quaresma, HJ; Santos, PM ; Serra, AC ; Sicard, E;
PUBLISHED: 2005, SOURCE: 12th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2005 in Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems
AUTHORS: Quaresma, HJ; Santos, PM ; Serra, AC ; Sicard, E;
PUBLISHED: 2005, SOURCE: 12th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2005 in Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems
INDEXED IN: Scopus 
CrossRef
Scopus CrossRef5
TITLE: High-voltage NMOS design in fully implanted twin-well CMOS Full Text
AUTHORS: Santos, PM ; Quaresma, H; Silva, AP; Lanca, M;
PUBLISHED: 2004, SOURCE: MICROELECTRONICS JOURNAL, VOLUME: 35, ISSUE: 9
AUTHORS: Santos, PM ; Quaresma, H; Silva, AP; Lanca, M;
PUBLISHED: 2004, SOURCE: MICROELECTRONICS JOURNAL, VOLUME: 35, ISSUE: 9
6
TITLE: Monitoring of waves with X-band radar in the port of Sines
AUTHORS: Izquierdo, P; Soares, CG ; Fontes, JB;
PUBLISHED: 2003, SOURCE: 3rd International Conference on Building the European Capacity for Operational Oceanography in BUILDING THE EUROPEAN CAPACITY IN OPERATIONAL OCEANOGRAPHY, PROCEEDINGS, VOLUME: 69, ISSUE: C
AUTHORS: Izquierdo, P; Soares, CG ; Fontes, JB;
PUBLISHED: 2003, SOURCE: 3rd International Conference on Building the European Capacity for Operational Oceanography in BUILDING THE EUROPEAN CAPACITY IN OPERATIONAL OCEANOGRAPHY, PROCEEDINGS, VOLUME: 69, ISSUE: C
7
TITLE: Design of High-Voltage devices in a fully implanted twin-well CMOS process
AUTHORS: Santos, PM; Quaresma, H; Silva, AP; Lanca, M;
PUBLISHED: 2003, SOURCE: 33rd European Solid-State Device Research Conference in ESSDERC 2003: PROCEEDINGS OF THE 33RD EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE
AUTHORS: Santos, PM; Quaresma, H; Silva, AP; Lanca, M;
PUBLISHED: 2003, SOURCE: 33rd European Solid-State Device Research Conference in ESSDERC 2003: PROCEEDINGS OF THE 33RD EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE
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TITLE: Error correction technique for dynamic impedance measurement
AUTHORS: Quaresma, H; Silva, AP; Serra, AC ;
PUBLISHED: 2003, SOURCE: 20th IEEE Instrumentation and Measurement Technology Conference in IMTC/O3: PROCEEDINGS OF THE 20TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 AND 2, VOLUME: 2
AUTHORS: Quaresma, H; Silva, AP; Serra, AC ;
PUBLISHED: 2003, SOURCE: 20th IEEE Instrumentation and Measurement Technology Conference in IMTC/O3: PROCEEDINGS OF THE 20TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 AND 2, VOLUME: 2
INDEXED IN: Scopus WOS
Scopus WOS