António João Fernandes Lourenço Gomes
AuthID: R-001-WA2
11
TITLE: A Transient Two-Tone RF Method for the Characterization of Electron Trapping Capture and Emission Dynamics in GaN HEMTs
AUTHORS: Tome, PM; Barradas, FM; Nunes, LC; Gomes, JL; Cunha, TR; Pedro, JC ;
PUBLISHED: 2020, SOURCE: IEEE/MTT-S International Microwave Symposium (IMS) in PROCEEDINGS OF THE 2020 IEEE/MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM (IMS)
AUTHORS: Tome, PM; Barradas, FM; Nunes, LC; Gomes, JL; Cunha, TR; Pedro, JC ;
PUBLISHED: 2020, SOURCE: IEEE/MTT-S International Microwave Symposium (IMS) in PROCEEDINGS OF THE 2020 IEEE/MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM (IMS)
INDEXED IN: 
WOS
WOS12
TITLE: Explaining the Different Time Constants Extracted from Low Frequency Y-22 and I-DS-DLTS on GaN HEMTs
AUTHORS: Gomes, JL; Nunes, LC; Pedro, JC ;
PUBLISHED: 2020, SOURCE: IEEE/MTT-S International Microwave Symposium (IMS) in PROCEEDINGS OF THE 2020 IEEE/MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM (IMS)
AUTHORS: Gomes, JL; Nunes, LC; Pedro, JC ;
PUBLISHED: 2020, SOURCE: IEEE/MTT-S International Microwave Symposium (IMS) in PROCEEDINGS OF THE 2020 IEEE/MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM (IMS)
INDEXED IN: WOS
WOS13
TITLE: Memristive Properties of GaN HEMTs Containing Deep-Level Traps Full Text
AUTHORS: Joao L Gomes; Luis C Nunes; Nikolai A Sobolev; Jose C Pedro ;
PUBLISHED: 2019, SOURCE: Symposium K on Defect-Induced Effects in Nanomaterials at the Meeting of the European-Materials-Research-Society in PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, VOLUME: 256, ISSUE: 5
AUTHORS: Joao L Gomes; Luis C Nunes; Nikolai A Sobolev; Jose C Pedro ;
PUBLISHED: 2019, SOURCE: Symposium K on Defect-Induced Effects in Nanomaterials at the Meeting of the European-Materials-Research-Society in PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, VOLUME: 256, ISSUE: 5
INDEXED IN: 
Scopus WOS
Scopus WOS14
TITLE: An Accurate Characterization of Capture Time Constants in GaN HEMTs
AUTHORS: Joao L Gomes; Luis C Nunes; Cristiano F Goncalves; Jose C Pedro ;
PUBLISHED: 2019, SOURCE: IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, VOLUME: 67, ISSUE: 7
AUTHORS: Joao L Gomes; Luis C Nunes; Cristiano F Goncalves; Jose C Pedro ;
PUBLISHED: 2019, SOURCE: IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, VOLUME: 67, ISSUE: 7
INDEXED IN: Scopus WOS
Scopus WOS