Combination of Semiconductor Parameter Analyzer and Conductive Atomic Force Microscope for Advanced Nanoelectronic Characterization

AuthID
 P-018-GT3
3
Author(s)
Jing, X
·
Lanza, M
Document Type
Book Chapter
Year published
2017
Published
in Conductive Atomic Force Microscopy: Applications in Nanomaterials
Pages: 225-241 (16)
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Scopus®
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Publication Identifiers
Scopus: 2-s2.0-105000619338
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