Combination of Semiconductor Parameter Analyzer and Conductive Atomic Force Microscope for Advanced Nanoelectronic Characterization

AuthID
P-018-GT3
3
Author(s)
Jing, X
·
Lanza, M
Tipo de Documento
Book Chapter
Year published
2017
Publicado
in Conductive Atomic Force Microscopy: Applications in Nanomaterials
Páginas: 225-241 (16)
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Publication Identifiers
SCOPUS: 2-s2.0-105000619338
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