A Robustness Analysis of Hot Spots Bias Points on the Finfet: A Simulation-Based Approach

AuthID
 P-019-XM9
9
Author(s)
Martins, R
·
Coelho, M
·
Toledo, P
·
Matos, A
·
Ferreira, R
·
Subrahmanyam, B
·
Oliveira, LB
·
Oliveira, JP
Document Type
Proceedings Paper
Year published
2025
Published
in 2025 9th International Young Engineers Forum on Electrical and Computer Engineering (YEF-ECE)
Pages: 175-179
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