A Robustness Analysis of Hot Spots Bias Points on the Finfet: A Simulation-Based Approach

AuthID
 P-019-XM9
9
Author(s)
Martins, R
·
Coelho, M
·
Toledo, P
·
Matos, A
·
Ferreira, R
·
Subrahmanyam, B
·
Tipo de Documento
Proceedings Paper
Year published
2025
Publicado
in 2025 9TH INTERNATIONAL YOUNG ENGINEERS FORUM ON ELECTRICAL AND COMPUTER ENGINEERING, YEF-ECE
Páginas: 175-179 (5)
Conference
9Th 8Th International Young Engineers Forum on Electrical and Computer Engineering-Yef-Ece, Date: JUL 04, 2025, Location: Lisbon, PORTUGAL
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Publication Identifiers
SCOPUS: 2-s2.0-105016194666
Wos: WOS:001582835400030
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