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Modeling of Image Formation of a Low-Cost White-Light Bench Microscope with a Linear Cmos Image Sensor: Its Application in Metrology - Art. No. 66170A

AuthID
P-004-DYM

Author(s)

Editor(s)

Bosse, H; Bodermann, B; Silver, RM

Document Type

Proceedings Paper

Year published

2007

Published

in Modeling Aspects in Optical Metrology in PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE), ISSN: 0277-786X

Volume: 6617, Pages: A6170-A6170 (10)

Conference

Conference on Modeling Aspects in Optical Metrology, Date: JUN 18-19, 2007, Location: Munich, GERMANY, Sponsors: SPIE Europe, European Opt Soc, Wissensch Gesell Lasertech e V

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Publication Identifiers

DOI: 10.1117/12.726392

Scopus: 2-s2.0-36248983280

Wos: WOS:000250109600008

Source Identifiers

ISSN: 0277-786X

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Modeling of Image Formation of a Low-Cost White-Light Bench Microscope with a Linear Cmos Image Sensor: Its Application in Metrology - Art. No. 66170A

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Modeling of Image Formation of a Low-Cost White-Light Bench Microscope with a Linear Cmos Image Sensor: Its Application in Metrology - Art. No. 66170A

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