Modeling of Image Formation of a Low-Cost White-Light Bench Microscope with a Linear Cmos Image Sensor: Its Application in Metrology - Art. No. 66170A

AuthID
P-004-DYM
3
Editor(s)
Bosse, H; Bodermann, B; Silver, RM
Document Type
Proceedings Paper
Year published
2007
Published
in Modeling Aspects in Optical Metrology in PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE), ISSN: 0277-786X
Volume: 6617, Pages: A6170-A6170 (10)
Conference
Conference on Modeling Aspects in Optical Metrology, Date: JUN 18-19, 2007, Location: Munich, GERMANY, Sponsors: SPIE Europe, European Opt Soc, Wissensch Gesell Lasertech e V
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Publication Identifiers
Scopus: 2-s2.0-36248983280
Wos: WOS:000250109600008
Source Identifiers
ISSN: 0277-786X
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