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Real Time Fault Injection Using Enhanced Ocd - A Performance Analysis

AuthID
P-004-R6J

Author(s)

Fidalgo, AV

Alves, GR

Ferreira, JM

Editor(s)

Werner, B

Document Type

Proceedings Paper

Year published

2006

Published

in 21st IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems, Proceedings in DFT, ISSN: 1550-5774

Pages: 254-262 (9)

Conference

21St Ieee International Symposium on Defect and Fault-Tolerance in Vlsi Systems, Date: OCT 04-06, 2006, Location: Arlington, VA, Sponsors: IEEE

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Metadata
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Publication Identifiers

DOI: 10.1109/dft.2006.51

Dblp: conf/dft/FidalgoAF06

Scopus: 2-s2.0-38749111829

Wos: WOS:000242580800027

Source Identifiers

ISSN: 1550-5774

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