- Publicações
- Pesquisar
- Estatísticas
Real Time Fault Injection Using Enhanced Ocd - A Performance Analysis
AuthID
P-004-R6J
P-004-R6J
3
Author(s)
1
Editor(es)
Werner,B
Tipo de Documento
Proceedings Paper
Year published
2006
Publicado
in 21ST IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT-TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS, ISSN: 1550-5774
Páginas: 254-+ (2)
Conference
21St Ieee International Symposium on Defect and Fault-Tolerance in Vlsi Systems, Date: OCT 04-06, 2006, Location: Arlington, VA, Patrocinadores: IEEE
Publication Identifiers
DOI: 10.1109/dft.2006.51
DBLP: conf/dft/FidalgoAF06
SCOPUS: 2-s2.0-38749111829
Wos: WOS:000242580800027
Source Identifiers
ISSN: 1550-5774
Export Publication Metadata
Publication Export Settings
Lista Marked
Citações
Oops! It looks like you don't have access to this content.
This section is restricted to uses with b-on access.
CORE Conference
No information about CORE Rank
During the preprocessing phase, only publications of type 'Proceedings Paper' or 'Proceedings' are automatically processed to identify their CORE Rank.
TIP: If your publication's CORE Rank is missing, you can contact with your institutional manager to have the correct ranking manually added to the record.
Journal Factors
Oops! It looks like you don't have access to this content.
This section is restricted to uses with b-on access.
Info
At this moment we don't have any links to full text documens.