in 4TH INTERNATIONAL WORKSHOP ON MICROPROCESSOR TEST AND VERIFICATION: COMMON CHALLENGES AND SOLUTIONS, PROCEEDINGS in Proceedings International Workshop on Microprocessor Test and Verification, ISSN: 1550-4093
Volume: 2003-January, Pages: 69-74 (6)
Conference
4Th International Workshop on Microprocessor Test and Verification, Date: MAY 29-30, 2003, Location: AUSTIN, TX, Sponsors: IEEE Comp Soc Test Technol Council