in Proceedings of SPIE - The International Society for Optical Engineering, ISSN: 0277-786X
Volume: 1332, Issue: pt 1, Pages: 166-184
Conference
Optical Testing and Metrology Iii: Recent Advances in Industrial Optical Inspection, Date: 8 July 1990 through 13 July 1990, Location: San Diego, CA, USA, Sponsors: SPIE
