in Proceedings of SPIE - The International Society for Optical Engineering, ISSN: 0277-786X
Volume: 1332, Número: pt 1, Páginas: 166-184
Conference
Optical Testing and Metrology Iii: Recent Advances in Industrial Optical Inspection, Date: 8 July 1990 through 13 July 1990, Location: San Diego, CA, USA, Patrocinadores: SPIE
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CORE Conference
No information about CORE Rank
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Journal Factors
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Info
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