Publications

On-Chip Built-In Self-Test of Video-Rate Adcs Using a 1.5 v Cmos Gaussian Noise Generator

AuthID
P-007-M40

Author(s)

Evans, G

Goes, J

Paulino, N

Document Type

Proceedings Paper

Year published

2006

Published

in 2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC

Pages: 669-672

Conference

2005 Ieee Conference on Electron Devices and Solid-State Circuits, Edssc, Date: 19 December 2005 through 21 December 2005, Location: Howloon, Sponsors: IEEE Electron Devices Society;IEEE Solid-State Circuits Society;IEEE Hong Kong Section;K. C. Wong Education Foundation;Solomon Systech Limited

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