Publications

Improving the Tolerance of Pipeline Based Circuits to Power Supply or Temperature Variations

AuthID
P-007-N5P

Author(s)

Semiao, J

Rodriguez Andina, JJ

Document Type

Proceedings Paper

Year published

2007

Published

in Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, ISSN: 1550-5774

Pages: 303-311

Conference

22Nd Ieee International Symposium on Defect and Fault-Tolerance in Vlsi Systems, Dft 2007, Date: 26 September 2007 through 28 September 2007, Location: Rome, Sponsors: The IEEE Computer Society Test;Technology Technical Council;The IEEE Computer Society Technical Committee;on Fault-Tolerant Computing

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