Investigating the Use of Bics to Detect Resistive- Open Defects in Srams

AuthID
 P-007-VXG
7
Author(s)
Chipana, R
·
Bolzani, L
·
Vargas, F
·
Rodriguez Andina, J
·
Document Type
Proceedings Paper
Year published
2010
Published
in Proceedings of the 2010 IEEE 16th International On-Line Testing Symposium, IOLTS 2010
Pages: 200-201
Conference
16Th Ieee International On-Line Testing Symposium, Iolts 2010, Date: 5 July 2010 through 7 July 2010, Location: Corfu Island, Sponsors: IEEE;TTTC
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Publication Identifiers
Scopus: 2-s2.0-77957992089
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