Optical Characterization of Zno

AuthID
P-000-VCM
3
Author(s)
Gaspar, C
·
Document Type
Article
Year published
2001
Published
in JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, ISSN: 0957-4522
Volume: 12, Issue: 4-6, Pages: 269-271 (3)
Conference
3Rd International Conference on Materials in Microelectronics, Date: OCT 16-17, 2000, Location: DUBLIN, IRELAND, Sponsors: Inst Mat, Inst Phys, IEEE Electron Devices Soc
Indexing
Publication Identifiers
Scopus: 2-s2.0-0035299494
Wos: WOS:000169734400016
Source Identifiers
ISSN: 0957-4522
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