- Publicações
- Pesquisar
- Estatísticas
Optical Characterization of Zno
AuthID
P-000-VCM
P-000-VCM
3
Author(s)
Tipo de Documento
Article
Year published
2001
Publicado
in JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, ISSN: 0957-4522
Volume: 12, Número: 4-6, Páginas: 269-271 (3)
Conference
3Rd International Conference on Materials in Microelectronics, Date: OCT 16-17, 2000, Location: DUBLIN, IRELAND, Patrocinadores: Inst Mat, Inst Phys, IEEE Electron Devices Soc
Publication Identifiers
SCOPUS: 2-s2.0-0035299494
Wos: WOS:000169734400016
Source Identifiers
ISSN: 0957-4522
Export Publication Metadata
Publication Export Settings
Lista Marked
Citações
Oops! It looks like you don't have access to this content.
This section is restricted to uses with b-on access.
CORE Conference
No information about CORE Rank
During the preprocessing phase, only publications of type 'Proceedings Paper' or 'Proceedings' are automatically processed to identify their CORE Rank.
TIP: If your publication's CORE Rank is missing, you can contact with your institutional manager to have the correct ranking manually added to the record.
Journal Factors
Oops! It looks like you don't have access to this content.
This section is restricted to uses with b-on access.
Full Text