Detection Angle Resolved Pixe and the Equivalent Depth Concept for Thin Film Characterization

AuthID
 P-000-2S6
7
Author(s)
Dimroth, F
·
Bett, AW
Tipo de Documento
Article
Year published
2005
Publicado
in X-RAY SPECTROMETRY, ISSN: 0049-8246
Volume: 34, Número: 4, Páginas: 372-375 (4)
Conference
10Th Pixe Conference, Date: JUN 04-08, 2004, Location: Portoroz, SLOVENIA
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Publication Identifiers
SCOPUS: 2-s2.0-22544444638
Wos: WOS:000230500800023
Source Identifiers
ISSN: 0049-8246
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