Vis/Nir Detector Based on Mu C-Si : H P-I-N Structures

AuthID
P-001-0HJ
6
Author(s)
Document Type
Article
Year published
2000
Published
in THIN SOLID FILMS, ISSN: 0040-6090
Volume: 364, Issue: 1-2, Pages: 204-208 (5)
Conference
Symposium P: Optical Characterization of Semiconductor Layers and Surfaces at the 1999 E-Mrs Spring Conference, Date: JUN 01-04, 1999, Location: STRASBOURG, FRANCE
Indexing
Publication Identifiers
Scopus: 2-s2.0-0033902436
Wos: WOS:000086555400039
Source Identifiers
ISSN: 0040-6090
Export Publication Metadata
Marked List
Info
At this moment we don't have any links to full text documens.