Vis/Nir Detector Based on Mu C-Si : H P-I-N Structures

AuthID
 P-001-0HJ
6
Author(s)
Macarico, A
·
Tipo de Documento
Article
Year published
2000
Publicado
in THIN SOLID FILMS, ISSN: 0040-6090
Volume: 364, Número: 1-2, Páginas: 204-208 (5)
Conference
Symposium P: Optical Characterization of Semiconductor Layers and Surfaces at the 1999 E-Mrs Spring Conference, Date: JUN 01-04, 1999, Location: STRASBOURG, FRANCE
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Publication Identifiers
SCOPUS: 2-s2.0-0033902436
Wos: WOS:000086555400039
Source Identifiers
ISSN: 0040-6090
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