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An Exact Solution to the Minimum Size Test Pattern Problem

AuthID
P-001-A1S

Author(s)

Flores, PF

Neto, HC

Silva, JPM

Document Type

Proceedings Paper

Year published

1998

Published

in INTERNATIONAL CONFERENCE ON COMPUTER DESIGN: VLSI IN COMPUTERS AND PROCESSORS, PROCEEDINGS in ICCD

Pages: 510-515 (6)

Conference

International Conference on Computer Design: Vlsi in Computers and Processors, Date: OCT 05-07, 1998, Location: AUSTIN, TX, Sponsors: IEEE, Comp Soc, IEEE, Circuits & Syst Soc, IEEE, Electron Devices Soc

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Metadata
Sources

Publication Identifiers

DOI: 10.1109/ICCD.1998.727097

Dblp: conf/iccd/FloresNS98

Scopus: 2-s2.0-0032302181

Wos: WOS:000076796900078

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An Exact Solution to the Minimum Size Test Pattern Problem

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