Publications

Robust Search Algorithms for Test Pattern Generation

AuthID
P-001-D0W

Author(s)

Silva, JPM

Sakallah, KA

Document Type

Proceedings Paper

Year published

1997

Published

in TWENTY-SEVENTH ANNUAL INTERNATIONAL SYMPOSIUM ON FAULT-TOLERANT COMPUTING, DIGEST OF PAPERS in INTERNATIONAL SYMPOSIUM ON FAULT-TOLERANT COMPUTING, ISSN: 0731-3071

Pages: 152-161 (10)

Conference

27Th Annual International Symposium on Fault-Tolerant Computing (Ftcs-27), Date: JUN 24-27, 1997, Location: SEATTLE, WA, Sponsors: IEEE Comp Soc, Tech Comm Fault Tolerant Comp, IFIP WG 10.4 Dependable Comp & Fault Tolerance

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