Some Structural Aspects of Pbxcd1-Xte Bulk Material

AuthID
 P-00F-QPH
4
Author(s)
Saucedo, E
·
Fornaro, L
·
Dieguez, E
Document Type
Article
Year published
2004
Published
in EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS, ISSN: 1286-0042
Volume: 27, Issue: 1-3, Pages: 427-430 (4)
Conference
10Th International Conference on Defects - Recognition, Imaging and Physics in Semiconductors (Drip 10), Date: SEP 29-OCT 02, 2003, Location: Batz sur Mer, FRANCE
Indexing
Wos®
Scopus®
Crossref®
Google Scholar®
Publication Identifiers
Scopus: 2-s2.0-10244279336
Wos: WOS:000224559500094
Source Identifiers
ISSN: 1286-0042
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

A place for researchers and their institutions

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service