Some Structural Aspects of Pbxcd1-Xte Bulk Material

AuthID
 P-00F-QPH
4
Author(s)
Saucedo, E
·
Fornaro, L
·
Dieguez, E
Tipo de Documento
Article
Year published
2004
Publicado
in EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS, ISSN: 1286-0042
Volume: 27, Número: 1-3, Páginas: 427-430 (4)
Conference
10Th International Conference on Defects - Recognition, Imaging and Physics in Semiconductors (Drip 10), Date: SEP 29-OCT 02, 2003, Location: Batz sur Mer, FRANCE
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Publication Identifiers
SCOPUS: 2-s2.0-10244279336
Wos: WOS:000224559500094
Source Identifiers
ISSN: 1286-0042
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