A New Nonlinear Model Extraction Methodology for Gan Hemts Subject to Trapping Effects

AuthID
 P-00G-TTH
4
Author(s)
Document Type
Proceedings Paper
Year published
2015
Published
in 2015 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM (IMS) in IEEE MTT-S International Microwave Symposium, ISSN: 0149-645X
Conference
Ieee Mtt-S International Microwave Symposium (Ims), Date: MAY 17-22, 2015, Location: Phoenix, AZ, Sponsors: IEEE MTT S
Indexing
Wos®
Scopus®
Crossref®
Google Scholar®
Publication Identifiers
Scopus: 2-s2.0-84946010861
Wos: WOS:000370722900274
Source Identifiers
ISSN: 0149-645X
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

A place for researchers and their institutions

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service