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Role of Trimethylboron to Silane Ratio on the Properties of
P
-Type Nanocrystalline Silicon Thin Film Deposited by Radio Frequency Plasma Enhanced Chemical Vapour Deposition
AuthID
P-00J-00A
5
Author(s)
Águas, H
·
Filonovich, SA
·
Bernacka-Wojcik, I
·
Fortunato, E
·
Martins, R
Document Type
Article
Year published
2010
Published
in
Journal of Nanoscience and Nanotechnology - J. Nanosci. Nanotech.,
ISSN: 1533-4880
Volume: 10, Issue: 4, Pages: 2547-2551
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DOI
:
10.1166/jnn.2010.1434
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ISSN
: 1533-4880
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