Exploiting Data Redundancy for Error Detection in Degraded Biometric Signatures Resulting From in the Wild Environments

AuthID
P-00N-6JA
2
Author(s)
Document Type
Proceedings Paper
Year published
2017
Published
in 2017 12TH IEEE INTERNATIONAL CONFERENCE ON AUTOMATIC FACE AND GESTURE RECOGNITION (FG 2017) in IEEE International Conference on Automatic Face and Gesture Recognition and Workshops, ISSN: 2326-5396
Pages: 981-986 (6)
Conference
12Th Ieee International Conference on Automatic Face and Gesture Recognition (Fg), Date: MAY 30-JUN 03, 2017, Location: Washington, DC, Sponsors: IEEE, Baidu, Mitsubishi Elect Res Labs Inc, 3dMD, DI4D, Syst & Technol Res, ObjectVideo Labs, MUKH Technologies, IEEE Comp Soc
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Publication Identifiers
Dblp: conf/fgr/NevesP17
Scopus: 2-s2.0-85026305608
Wos: WOS:000414287400136
Source Identifiers
ISSN: 2326-5396
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