From Etl Conceptual Design to Etl Physical Sketching Using Patterns

AuthID
 P-00N-XPJ
2
Author(s)
4
Editor(s)
Slimane Hammoudi; Michal Smialek; Olivier Camp; Joaquim Filipe
Document Type
Proceedings Paper
Year published
2018
Published
in Proceedings of the 20th International Conference on Enterprise Information Systems, ICEIS 2018, Funchal, Madeira, Portugal, March 21-24, 2018, Volume 1. in ICEIS (1)
Pages: 262-269
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Dblp®/en/publications/view/718546
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Publication Identifiers
Dblp: conf/iceis/OliveiraB18
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