From Etl Conceptual Design to Etl Physical Sketching Using Patterns

AuthID
P-00N-XPJ
2
Author(s)
4
Editor(es)
Hammoudi,S;Smialek,M;Camp,O;Filipe,J
Tipo de Documento
Proceedings Paper
Year published
2018
Publicado
in Proceedings of the 20th International Conference on Enterprise Information Systems, ICEIS 2018, Funchal, Madeira, Portugal, March 21-24, 2018, Volume 1. in ICEIS (1), ISSN: 2184-4992
Volume: 1, Páginas: 262-269 (7)
Indexing
Publication Identifiers
DBLP: conf/iceis/OliveiraB18
SCOPUS: 2-s2.0-85047770384
Source Identifiers
ISSN: 2184-4992
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