Publications

Methods for Fast Yield Learning in a Dram Wafer Fab Using a Remote Packaging and Test Site.

AuthID
P-00P-3KG

Author(s)

Trahan, R

Chapman, R

Gumaer, N

Hill, W

Bicho, A

Gomes, M

Document Type

Proceedings Paper

Year published

2006

Published

in 2006 IEEE/SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE AND WORKSHOP in Advanced Semiconductor Manufacturing Conference and Workshop-Proceedings, ISSN: 1078-8743

Pages: 222-+ (2)

Conference

Ieee/Semi Advanced Semiconductor Manufacturing Conference and Workshop, Date: MAY 22-24, 2006, Location: Boston, MA, Sponsors: IEEE, SEMI, MICRO, AMCG, ASAHI/AMER, Blue Shift, Entegris, Fairchild Semiconductor, FSI Int, KLA Tencor, Nikon

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