Methods for Fast Yield Learning in a Dram Wafer Fab Using a Remote Packaging and Test Site.

AuthID
P-00P-3KG
6
Author(s)
Trahan, R
·
Chapman, R
·
Gumaer, N
·
Hill, W
·
Bicho, A
·
Tipo de Documento
Proceedings Paper
Year published
2006
Publicado
in 2006 IEEE/SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE AND WORKSHOP in Advanced Semiconductor Manufacturing Conference and Workshop-Proceedings, ISSN: 1078-8743
Páginas: 222-+ (2)
Conference
Ieee/Semi Advanced Semiconductor Manufacturing Conference and Workshop, Date: MAY 22-24, 2006, Location: Boston, MA, Patrocinadores: IEEE, SEMI, MICRO, AMCG, ASAHI/AMER, Blue Shift, Entegris, Fairchild Semiconductor, FSI Int, KLA Tencor, Nikon
Indexing
Publication Identifiers
Wos: WOS:000241699400043
Source Identifiers
ISSN: 1078-8743
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