Measuring Improvement of F1-Scores in Detection of Self-Admitted Technical Debt

AuthID
 P-00Y-5MH
6
Author(s)
Aiken, W
·
Mvula, PK
·
Jourdan, GV
·
Sabetzadeh, M
·
Viktor, HL
Document Type
Proceedings Paper
Year published
2023
Published
in 2023 ACM/IEEE International Conference on Technical Debt (TechDebt), Melbourne, Australia, May 14-15, 2023 in TechDebt@ICSE
Pages: 37-41
Indexing
Dblp®/en/publications/view/988817
Publication Identifiers
Dblp: conf/techdebt/AikenMBJSV23
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

A place for researchers and their institutions

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service