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Measuring Improvement of F1-Scores in Detection of Self-Admitted Technical Debt
AuthID
P-00Y-5MH
6
Author(s)
Aiken, W
·
Mvula, PK
·
Branco, P
·
Jourdan, GV
·
Sabetzadeh, M
·
Viktor, HL
Document Type
Proceedings Paper
Year published
2023
Published
in
2023 ACM/IEEE International Conference on Technical Debt (TechDebt), Melbourne, Australia, May 14-15, 2023
in
TechDebt@ICSE
Pages: 37-41
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/pt/publications/view/988817
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: conf/techdebt/AikenMBJSV23
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