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251

TÃTULO: Characterization of transparent and conductive ZnO : Ga thin films produced by rf sputtering at room temperature
AUTORES: Fortunato, E ; Assuncao, V; Marques, A; Ferreira, I ; Aguas, H ; Pereira, L ; Martins, R ;
PUBLICAÇÃO: 2003, FONTE: Symposium on Compound Semiconductor Photovoltaics held at the MRS Spring Meeting in COMPOUND SEMICONDUCTOR PHOTOVOLTAICS, VOLUME: 763

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252

TÃTULO: Correlation between the tunnelling oxide and I-V curves of MIS photodiodes
AUTORES: Aguas, H ; Pereira, L ; Goullet, A; Silva, R ; Fortunato, E ; Martins, R ;
PUBLICAÇÃO: 2003, FONTE: Symposium on Amorphous and Nanocrystalline Silicon-Based Films held at the 2003 MRS Spring Meeting in AMORPHOUS AND NANOCRYSTALLINE SILICON-BASED FILMS-2003, VOLUME: 762

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253

TÃTULO: Correlation Between the Tunnelling Oxide and I-V Curves of MIS Photodiodes
AUTORES: Águas, H; Pereira, L ; Goullet, A; Silva, R; Fortunato, E; Martins, R;
PUBLICAÇÃO: 2003, FONTE: MRS Proceedings, VOLUME: 762

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254

TÃTULO: Gallium zinc oxide coated polymeric substrates for optoelectronic applications
AUTORES: Fortunato, E ; Goncalves, A; Marques, A; Assuncao, V; Ferreira, I ; Aguas, H ; Pereira, L ; Martins, R ;
PUBLICAÇÃO: 2003, FONTE: Symposium on Flexible Electronics-Materials and Device Technology held at the 2003 MRS Spring Meeting in FLEXIBLE ELECTRONICS-MATERIALS AND DEVICE TECHNOLOGY, VOLUME: 769

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255

TÃTULO: Growth of ZnO : Ga thin films at room temperature on polymeric substrates: thickness dependence Full Text
AUTORES: Fortunato, E ; Goncalves, A; Assuncao, V; Marques, A; Aguas, H ; Pereira, L ; Ferreira, I ; Martins, R ;
PUBLICAÇÃO: 2003, FONTE: 4th International Conference on Coatings on Glass in THIN SOLID FILMS, VOLUME: 442, NÚMERO: 1-2

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256

TÃTULO: Polymorphous silicon films produced in large area reactors by PECVD at 27.12 MHz and 13.56 MHz
AUTORES: Aguas, H ; Raniero, L; Pereira, L ; Fortunato, E ; Cabarrocas, PRI; Martins, R ;
PUBLICAÇÃO: 2003, FONTE: Symposium on Amorphous and Nanocrystalline Silicon-Based Films held at the 2003 MRS Spring Meeting in AMORPHOUS AND NANOCRYSTALLINE SILICON-BASED FILMS-2003, VOLUME: 762

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257

TÃTULO: Spectroscopic ellipsometry study of amorphous silicon anodically oxidised Full Text
AUTORES: Aguas, H ; Goncalves, A; Pereira, L ; Silva, R; Fortunato, E ; Martins, R ;
PUBLICAÇÃO: 2003, FONTE: 4th Symposium on Thin Films for Large Area Electronics held at the EMRS 2002 Spring Conference in THIN SOLID FILMS, VOLUME: 427, NÚMERO: 1-2

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