Manuel Fernando Goncalves Vieira


AuthID: R-000-A3T

Confirmed Publications: 141



101
TITLE: Production of intermetallic compounds from Ti/Al and Ni/Al multilayer thin films-A comparative study  Full Text
AUTHORS: Ramos, AS ; Vieira, MT ; Morgiel, J; Grzonka, J; Simoes, S ; Vieira, Manuel ;
PUBLISHED: 2009, SOURCE: JOURNAL OF ALLOYS AND COMPOUNDS, VOLUME: 484, ISSUE: 1-2
INDEXED IN: Scopus WOS CrossRef: 64
IN MY: ORCID | ResearcherID
102
TITLE: Strain path and work-hardening behavior of brass  Full Text
AUTHORS: Sakharova, NA ; Fernandes, JV ; Vieira, Manuel ;
PUBLISHED: 2009, SOURCE: MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, VOLUME: 507, ISSUE: 1-2
INDEXED IN: Scopus WOS CrossRef: 9
IN MY: ORCID | ResearcherID
103
TITLE: Bonding gamma-TiAl alloys using Ti/Al nanolayers doped with Ag
AUTHORS: Duarte, LI; Viana, Filomena ; Vieira, Manuel ; Ramos, AS ; Vieira, MT; Klotz, UE;
PUBLISHED: 2008, SOURCE: 13th Conference of the Sociedade-Portuguesa-de-Materiais/4th International Materials Symposium in ADVANCED MATERIALS FORUM IV, VOLUME: 587-588
INDEXED IN: Scopus WOS CrossRef: 3
IN MY: ORCID | ResearcherID
104
TITLE: Diffusion Brazing of a gamma-TiAl Alloy Using Tini 67: Microstructural Evolution of the Interface
AUTHORS: Guedes, A; Viana, Filomena ; Pinto, AMP; Vieira, Manuel ;
PUBLISHED: 2008, SOURCE: 13th Conference of the Sociedade-Portuguesa-de-Materiais/4th International Materials Symposium in ADVANCED MATERIALS FORUM IV, VOLUME: 587-588
INDEXED IN: Scopus WOS CrossRef: 5
IN MY: ORCID | ResearcherID
105
TITLE: Effect of Annealing Conditions on the Grain Size of Nanocrystalline Copper Thin Films
AUTHORS: Simoes, S ; Calinas, R; Ferreira, PJ; Vieira, MT ; Viana, Filomena ; Vieira, Manuel ;
PUBLISHED: 2008, SOURCE: 13th Conference of the Sociedade-Portuguesa-de-Materiais/4th International Materials Symposium in ADVANCED MATERIALS FORUM IV, VOLUME: 587-588
INDEXED IN: Scopus WOS
IN MY: ORCID | ResearcherID
106
TITLE: Effect of Annealing Conditions on the Grain Size of Nanocrystalline Copper Thin Films
AUTHORS: Sonia Simões ; Rosa Calinas; P.J Ferreira; Teresa T Vieira; Viana, Filomena ; Vieira, Manuel ;
PUBLISHED: 2008, SOURCE: Materials Science Forum, VOLUME: 587-588
INDEXED IN: CrossRef: 7
IN MY: ORCID | ResearcherID
107
TITLE: Materials Science Forum: Foreword
AUTHORS: Marques, AT ; Silva, AF ; Baptista, APM; Sa, C ; Jorge Lino Alves ; Malheiros, LF ; Vieira, Manuel ;
PUBLISHED: 2008, SOURCE: Advanced Materials Forum IV - Selected, peer reviewed papers from the 4th International Materials Symposium Materiais 2007 and 8th Encontro da Sociedade Portuguesa de Materiais - SPM in Materials Science Forum, VOLUME: 587-588
INDEXED IN: Scopus
IN MY: ORCID
108
TITLE: Microstructure evolution during Ni/Al multilayer reactions  Full Text
AUTHORS: Simões, S; Viana, Filomena ; Ramos, AS; Vieira, MT; Vieira, Manuel ;
PUBLISHED: 2008, SOURCE: EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany
INDEXED IN: CrossRef
IN MY: ORCID | ResearcherID
109
TITLE: Strain Path Change Effect on Deformation Behaviour of Materials with Low-to-Moderate Stacking Fault Energy
AUTHORS: Sakharova, NA ; Vieira, MM ; Fernandes, JV ; Vieira, Manuel ;
PUBLISHED: 2008, SOURCE: 13th Conference of the Sociedade-Portuguesa-de-Materiais/4th International Materials Symposium in ADVANCED MATERIALS FORUM IV, VOLUME: 587-588
INDEXED IN: Scopus WOS CrossRef: 1
IN MY: ORCID | ResearcherID
110
TITLE: TEM and SEM in-situ annealing of nanocrystalline copper thin films
AUTHORS: Simoes, S ; Calinas, R; Ferreira, PJ; Viana, Filomena ; Vieira, MT ; Vieira, Manuel ;
PUBLISHED: 2008, SOURCE: MICROSCOPY AND MICROANALYSIS, VOLUME: 14, ISSUE: SUPPL. 3
INDEXED IN: Scopus WOS CrossRef: 4
IN MY: ORCID | ResearcherID
Página 11 de 15. Total de resultados: 141.

Um espaço para investigadores e suas instituições

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service