Nuno Pessoa Barradas


AuthID: R-000-DV0

Confirmed Publications: 263



161
TITLE: Formation of AlxGa1-xSb films over GaSb substrates by Al diffusion
AUTHORS: Ruiz, CM; Barradas, NP ; Alves, E ; Plaza, JL; Bermudez, V; Dieguez, E;
PUBLISHED: 2004, SOURCE: 10th International Conference on Defects - Recognition, Imaging and Physics in Semiconductors (DRIP 10) in EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS, VOLUME: 27, ISSUE: 1-3
INDEXED IN: Scopus WOS CrossRef
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162
TITLE: He-RBS, He-ERDA and heavy ion-ERDA analysis of Si/Ta 70 Å/CoFe 35 Å/HfAlOx/CoFe 35 Å/Ta 30 Å systems  Full Text
AUTHORS: Barradas, NP ; Matias, V; Sequeira, AD; Soares, JC ; Kreissig, U; Wang, JU; Freitas, PP ;
PUBLISHED: 2004, SOURCE: Proceedings of the Sixteenth International Conference on Ion in Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, VOLUME: 219-220, ISSUE: 1-4
INDEXED IN: Scopus CrossRef
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163
TITLE: He-RBS, He-ERDA and heavy ion-ERDA analysis of Si/Ta 70A/CoFe 35 A/HfAlOx/CoFe 35 A/Ta 30 A systems  Full Text
AUTHORS: Barradas, NP ; Matias, V; Sequelra, AD; Soares, JC ; Kreissig, U; Wang, JU; Freltas, PP ;
PUBLISHED: 2004, SOURCE: 16th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 219
INDEXED IN: WOS
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164
TITLE: Ion beam analysis of TiN/Ti multilayers deposited by magnetron sputtering  Full Text
AUTHORS: Andrade, E; Flores, M; Muhl, S; Barradas, NP ; Murillo, G; Zavala, EP; Rocha, MF;
PUBLISHED: 2004, SOURCE: 16th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 219, ISSUE: 1-4
INDEXED IN: Scopus WOS CrossRef
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165
TITLE: Ion beam studies of TiNxOy thin films deposited by reactive magnetron sputtering  Full Text
AUTHORS: Alves, E ; Ramos, AR ; Barradas, NP ; Vaz, F ; Cerqueira, P; Rebouta, L ; Kreissig, U;
PUBLISHED: 2004, SOURCE: Symposium on Protective Coatings and Thin Films held at the E-MRS 20th Spring Meeting in SURFACE & COATINGS TECHNOLOGY, VOLUME: 180
INDEXED IN: Scopus WOS CrossRef
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166
TITLE: RBS analysis of AlGaSb thin films  Full Text
AUTHORS: Barradas, NP ; Alves, E ; Ruiz, CM; Dieguez, E; Dimroth, F; Chenot, MA; Bett, A;
PUBLISHED: 2004, SOURCE: 16th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 219, ISSUE: 1-4
INDEXED IN: Scopus WOS CrossRef
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167
TITLE: Roughness in GaN/InGaN films and multilayers determined with Rutherford backscattering  Full Text
AUTHORS: Barradas, NP ; Alves, E ; Pereira, S ; Shvartsman, VV; Kholkin, AL ; Pereira, E; O'Donnell, KP; Liu, C; Deatcher, CJ; Watson, IM; Mayer, M;
PUBLISHED: 2004, SOURCE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 217, ISSUE: 3
INDEXED IN: Scopus WOS CrossRef: 28
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168
TITLE: Stabilization of ZrO2PVD coatings with Gd2O3  Full Text
AUTHORS: Portinha, A; Teixeira, V ; Carneiro, J ; Costa, MF ; Barradas, NP ; Sequeira, AD;
PUBLISHED: 2004, SOURCE: 31st International Conference on Metallurgical Coatings and Thin Films in SURFACE & COATINGS TECHNOLOGY, VOLUME: 188, ISSUE: 1-3 SPEC.ISS.
INDEXED IN: Scopus WOS CrossRef
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169
TITLE: A training algorithm for classification of high-dimensional data  Full Text
AUTHORS: Vieira, A; Barradas, N ;
PUBLISHED: 2003, SOURCE: NEUROCOMPUTING, VOLUME: 50
INDEXED IN: Scopus WOS CrossRef
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170
TITLE: Advanced data analysis techniques for ion beam analysis  Full Text
AUTHORS: Barradas, NP ;
PUBLISHED: 2003, SOURCE: Workshop on Modern Surface Analytical Techniques in SURFACE AND INTERFACE ANALYSIS, VOLUME: 35, ISSUE: 9
INDEXED IN: Scopus WOS CrossRef
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Página 17 de 27. Total de resultados: 263.

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