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162

TÃTULO: Artificial neural networks for instantaneous analysis of real-time Rutherford backscattering spectra Full Text
AUTORES: Demeulemeester, J; Smeets, D; Barradas, NP ; Vieira, A; Comrie, CM; Temst, K; Vantomme, A;
PUBLICAÇÃO: 2010, FONTE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 268, NÚMERO: 10

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163

TÃTULO: Carbon film growth and hydrogenic retention of tungsten exposed to carbon-seeded high density deuterium plasmas Full Text
AUTORES: Wright, GM; Al, RS; Alves, E ; Alves, LC ; Barradas, NP ; Kleyn, AW; Lopes J L Cardozo; van der Meiden, HJ; Philipps, V; van Rooij, GJ; Shumack, AE; Vijvers, WAJ; Westerhout, J; Zoethout, E; Rapp, J;
PUBLICAÇÃO: 2010, FONTE: JOURNAL OF NUCLEAR MATERIALS, VOLUME: 396, NÚMERO: 2-3

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164

TÃTULO: CdTe detector use for PIXE characterization of TbCoFe thin films Full Text
AUTORES: Chaves, PC ; Taborda, A ; Barradas, NP ; Miguel A. Reis ;
PUBLICAÇÃO: 2010, FONTE: 19th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 268, NÚMERO: 11-12

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165

TÃTULO: Effect of annealing on AlN/GaN quantum dot heterostructures: Advanced ion beam characterization and X-ray study of low-dimensional structures Full Text
AUTORES: Magalhaes, S; Lorenz, K ; Franco, N; Barradas, NP ; Alves, E ; Monteiro, T ; Amstatt, B; Fellmann, V; Daudin, B;
PUBLICAÇÃO: 2010, FONTE: 7th International Symposium on Atomic Level Characterizations for New Materials and Devices in SURFACE AND INTERFACE ANALYSIS, VOLUME: 42, NÚMERO: 10-11

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166

TÃTULO: Electrical and Raman Scattering Studies of ZnO:P and ZnO:Sb Thin Films
AUTORES: de Campos, JA; Viseu, T ; Rolo, AG ; Barradas, NP ; Alves, E ; de Lacerda Aroso, T ; Cerqueira, MF ;
PUBLICAÇÃO: 2010, FONTE: 2nd International Conference on Advanced Nano Materials in JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, VOLUME: 10, NÚMERO: 4

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167

TÃTULO: Enhancement of the photocatalytic nature of nitrogen-doped PVD-grown titanium dioxide thin films (vol 106, 113535, 2009) Full Text
AUTORES: Tavares, CJ ; Marques, SM; Viseu, T ; Teixeira, V ; Carneiro, JO ; Alves, E ; Barradas, NP ; Munnik, F; Girardeau, T; P Riviere;
PUBLICAÇÃO: 2010, FONTE: JOURNAL OF APPLIED PHYSICS, VOLUME: 107, NÚMERO: 5

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168

TÃTULO: Erosion and re-deposition processes in JET tiles studied with ion beams Full Text
AUTORES: Alves, LC ; Alves, E ; Barradas, NP ; Mateus, R ; Carvalho, P ; Coad, JP; Widdowson, AM; Likonen, J; Koivuranta, S;
PUBLICAÇÃO: 2010, FONTE: 19th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 268, NÚMERO: 11-12

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