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823

TÃTULO: Photoluminescence and lattice location of Eu and Pr implanted GaN samples Full Text
AUTORES: Monteiro, T ; Boemare, C; Soares, MJ ; Ferreira, RAS ; Carlos, LD ; Lorenz, K ; Vianden, R; Alves, E ;
PUBLICAÇÃO: 2001, FONTE: 21st International Conference on Defects in Semiconductors in PHYSICA B-CONDENSED MATTER, VOLUME: 308

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824

TÃTULO: Photoluminescence studies in ZnO samples Full Text
AUTORES: Boemare, C; Monteiro, T ; Soares, MJ ; Guilherme, JG; Alves, E ;
PUBLICAÇÃO: 2001, FONTE: 21st International Conference on Defects in Semiconductors in PHYSICA B-CONDENSED MATTER, VOLUME: 308

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825

TÃTULO: Raman spectroscopy studies in InGaN/GaN wurtzite epitaxial films
AUTORES: Correia, MR ; Pereira, S ; Monteiro, T ; Pereira, E; Alves, E ;
PUBLICAÇÃO: 2001, FONTE: GaN and Related Alloys 2000 in Materials Research Society Symposium - Proceedings, VOLUME: 639

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826

TÃTULO: Spectroscopic ellipsometry study of the layer structure and impurity content in Er-doped nanocrystalline silicon thin films Full Text
AUTORES: Losurdo, M; Cerqueira, MF ; Stepikhova, MV; Alves, E ; Giangregorio, MM; Pinto, P; Ferreira, JA;
PUBLICAÇÃO: 2001, FONTE: 21st International Conference on Defects in Semiconductors in PHYSICA B-CONDENSED MATTER, VOLUME: 308

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827

TÃTULO: Strain and compositional analysis of InGaN/GaN layers
AUTORES: Pereira, S ; Correia, MR ; Pereira, E; Trager Cowan, C; Sweeney, F; Edwards, PR; O'Donnell, KP; Alves, E ; Sequeira, AD; Franco, N;
PUBLICAÇÃO: 2001, FONTE: GaN and Related Alloys 2000 in Materials Research Society Symposium - Proceedings, VOLUME: 639

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828

TÃTULO: Study of Fe+ implanted GaN Full Text
AUTORES: Alves, E ; Liu, C; Waerenborgh, JC ; da Silva, MF; Soares, JC ;
PUBLICAÇÃO: 2001, FONTE: 12th International Conference on Ion Beam Modification of Materials (IBMM2000) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 175

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829

TÃTULO: Study of new surface structures created on sapphire by Co ion implantation Full Text
AUTORES: Marques, C; Cruz, MM ; da Silva, RC; Alves, E ;
PUBLICAÇÃO: 2001, FONTE: 12th International Conference on Ion Beam Modification of Materials (IBMM2000) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 175

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830

TÃTULO: Study of solid-state reactions of SiC/SiCf composites using microbeams Full Text
AUTORES: Alves, LC ; Alves, E ; da Silva, MF; Soares, JC; Paul, A; La Barbera, A; Riccardi, B;
PUBLICAÇÃO: 2001, FONTE: 7th International Conference on Nuclear Microprobe Technology and Applications in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 181, NÚMERO: 1-4

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