61
TITLE: Variance of the cumulative histogram of ADCs due to frequency errors
AUTHORS: Alegria, FAC ; Serra, AMD ;
PUBLISHED: 2003, SOURCE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 52, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
62
TITLE: An ADC histogram test based on small-amplitude waves  Full Text
AUTHORS: Alegria, FC ; Arpaia, P; Daponte, P; Serra, AC ;
PUBLISHED: 2002, SOURCE: 16th IMEKO World Congress in MEASUREMENT, VOLUME: 31, ISSUE: 4
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
63
TITLE: Performance analysis of an ADC histogram test using small triangular waves
AUTHORS: Alegria, F ; Arpaia, P; Serra, AMD ; Daponte, P;
PUBLISHED: 2002, SOURCE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 51, ISSUE: 4
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
64
TITLE: ADC histogram test by triangular small-waves
AUTHORS: Alegria, F ; Arpaia, P; Serra, AMD ; Daponte, P;
PUBLISHED: 2001, SOURCE: 18th IEEE Instrumentation and Measurement Technology Conference (IMTC/2001) in IMTC/2001: PROCEEDINGS OF THE 18TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-3: REDISCOVERING MEASUREMENT IN THE AGE OF INFORMATICS, VOLUME: 3
INDEXED IN: Scopus WOS
IN MY: ORCID
65
TITLE: Influence of frequency errors in the variance of the cumulative histogram
AUTHORS: Alegria, FAC ; Serra, AMD ;
PUBLISHED: 2001, SOURCE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 50, ISSUE: 2
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
66
TITLE: Variance of the cumulative histogram of ADCs due to frequency errors
AUTHORS: Alegria, FC ; Serra, AC ;
PUBLISHED: 2001, SOURCE: 18th IEEE Instrumentation and Measurement Technology Conference (IMTC/2001) in IMTC/2001: PROCEEDINGS OF THE 18TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-3: REDISCOVERING MEASUREMENT IN THE AGE OF INFORMATICS, VOLUME: 3
INDEXED IN: Scopus WOS
IN MY: ORCID
67
TITLE: Automatic calibration of analog and digital measuring instruments using computer vision
AUTHORS: Alegria, FC ; Serra, AC ;
PUBLISHED: 2000, SOURCE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 49, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
68
TITLE: Characterization of ADCs using a FM signal
AUTHORS: Ramos, HM ; Alegria, FC ;
PUBLISHED: 2000, SOURCE: Conference on Precision Electromagnetic Measurements (CPEM 2000) in 2000 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS DIGEST
INDEXED IN: Scopus WOS
IN MY: ORCID
69
TITLE: Computer vision applied to the automatic calibration of measuring instruments  Full Text
AUTHORS: Alegria, FC ; Serra, AC ;
PUBLISHED: 2000, SOURCE: MEASUREMENT, VOLUME: 28, ISSUE: 3
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
70
TITLE: Influence of frequency errors in the variance of the cumulative histogram
AUTHORS: Alegria, FC ; Serra, AC ;
PUBLISHED: 2000, SOURCE: Conference on Precision Electromagnetic Measurements (CPEM 2000) in 2000 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS DIGEST
INDEXED IN: Scopus WOS
IN MY: ORCID
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