Henrique Leonel Gomes


AuthID: R-000-5XR

Confirmed Publications: 86



1
TITLE: Sudden death of organic light-emitting diodes  Full Text
AUTHORS: Paulo R F Rocha; Henrique L Gomes ; Kamal Asadi; Ilias Katsouras; Benjamin Bory; Frank Verbakel; Peter van de Weijer; Dago M de Leeuw; Stefan C J Meskers;
PUBLISHED: 2015, SOURCE: ORGANIC ELECTRONICS, VOLUME: 20
INDEXED IN: Scopus WOS CrossRef
2
TITLE: Lithium fluoride injection layers can form quasi-Ohmic contacts for both holes and electrons  Full Text
AUTHORS: Benjamin F Bory; Paulo R F Rocha; Rene A J Janssen; Henrique L Gomes ; Dago M De Leeuw; Stefan C J Meskers;
PUBLISHED: 2014, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 105, ISSUE: 12
INDEXED IN: Scopus WOS CrossRef
3
TITLE: Relation between the electroforming voltage in alkali halide-polymer diodes and the bandgap of the alkali halide  Full Text
AUTHORS: Benjamin F Bory; Jingxin X Wang; Henrique L Gomes ; Rene A J Janssen; Dago M De Leeuw; Stefan C J Meskers;
PUBLISHED: 2014, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 105, ISSUE: 23
INDEXED IN: Scopus WOS CrossRef
4
TITLE: Inkjet-printed organic electronics: Operational stability and reliability issues
AUTHORS: Medeiros, MCR; Martinez Domingo, C; Ramon, E; Negrier, AT; Sowade, E; Mitra, KY; Baumann, RR; McCulloch, I; Carrabina, J; Gomes, HL ;
PUBLISHED: 2013, SOURCE: Symposium on Organic Semiconductor Materials, Devices, and Processing 4 - 223rd Meeting of the Electrochemical Society in ECS Transactions, VOLUME: 53, ISSUE: 26
INDEXED IN: Scopus CrossRef: 1
5
TITLE: Low-frequency noise as a diagnostic tool for OLED reliability
AUTHORS: Rocha, PRF; Vandamme, LKJ; Meskers, SCJ; Gomes, HL ; De Leeuw, DM; Van De Weijer, P;
PUBLISHED: 2013, SOURCE: 2013 22nd International Conference on Noise and Fluctuations, ICNF 2013 in 2013 22nd International Conference on Noise and Fluctuations, ICNF 2013
INDEXED IN: Scopus CrossRef
IN MY: ORCID
6
TITLE: Reversible post-breakdown conduction in aluminum oxide-polymer capacitors  Full Text
AUTHORS: Qian Chen; Henrique L Gomes ; Paulo R F Rocha; Dago M de Leeuw; Stefan C J Meskers;
PUBLISHED: 2013, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 102, ISSUE: 15
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
7
TITLE: The role of internal structure in the anomalous switching dynamics of metal-oxide/polymer resistive random access memories  Full Text
AUTHORS: Paulo R F Rocha; Asal Kiazadeh; Dago M De Leeuw; Stefan C J Meskers; Frank Verbakel; David M Taylor; Henrique L Gomes ;
PUBLISHED: 2013, SOURCE: JOURNAL OF APPLIED PHYSICS, VOLUME: 113, ISSUE: 13
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
8
TITLE: Dynamic Behavior of Resistive Random Access Memories (RRAMS) Based on Plastic Semiconductor
AUTHORS: Paulo R F Rocha; Asal Kiazadeh; Qian Chen; Henrique L Gomes ;
PUBLISHED: 2012, SOURCE: 3rd IFIP/SOCOLNET Doctoral Conference on Computing, Electrical and Industrial Systems in TECHNOLOGICAL INNOVATION FOR VALUE CREATION, VOLUME: 372
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
9
TITLE: Dynamics of charge carrier trapping in NO2 sensors based on ZnO field-effect transistors  Full Text
AUTHORS: Anne Marije Andringa; Nynke Vlietstra; Edsger C P Smits; Mark Jan Spijkman; Henrique L Gomes ; Johan H Klootwijk; Paul W M Blom; Dago M de Leeuw;
PUBLISHED: 2012, SOURCE: SENSORS AND ACTUATORS B-CHEMICAL, VOLUME: 171
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
10
TITLE: Electroforming Process in Metal-Oxide-Polymer Resistive Switching Memories
AUTHORS: Qian Chen; Henrique L Gomes ; Asal Kiazadeh; Paulo R F Rocha; Dago M De Leeuw; Stefan C J Meskers;
PUBLISHED: 2012, SOURCE: 3rd IFIP/SOCOLNET Doctoral Conference on Computing, Electrical and Industrial Systems in TECHNOLOGICAL INNOVATION FOR VALUE CREATION, VOLUME: 372
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
Página 1 de 9. Total de resultados: 86.

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