João Paulo Cacho Teixeira


AuthID: R-000-7A4

Confirmed Publications: 110



71
TITLE: Design and evaluation of the clear-PEM detector for positron emission mammography
AUTHORS: Santos, AI; Almeida, P ; Martins, MV ; Matela, N ; Oliveira, N; Ferreira, NC; Aguiar, JD; Almeida, FG ; Lopes, F; Sampaio, J; Bento, P; Goncalves, F ; Leong, C; Lousa, P; Silva, L; Teixeira, IC ; Teixeira, JP ; Abreu, MC ; Carrico, B; Mendes, PR; Pereira, R; Sousa, P; Ferreira, M; Moura, R; Ortigao, C ; Peralta, L ; Ribeiro, R; Rodrigues, P; Silva, JC; Trindade, A; Varela, J ; ...More
PUBLISHED: 2004, SOURCE: Nuclear Science Symposium/Medical Imaging Conference in 2004 IEEE Nuclear Science Symposium Conference Record, Vols 1-7, VOLUME: 6
INDEXED IN: Scopus WOS CrossRef: 9
IN MY: ORCID
72
TITLE: FPGAs BIST evaluation
AUTHORS: Parreira, A; Teixeira, JP ; Santos, MB ;
PUBLISHED: 2004, SOURCE: 14th International Conference on Field-Programmable Logic and Applications in FIELD-PROGRAMMABLE LOGIC AND APPLICATIONS, PROCEEDINGS, VOLUME: 3203
INDEXED IN: Scopus WOS
IN MY: ORCID
73
TITLE: Modeling and simulation of time domain faults in digital systems
AUTHORS: Junior, DB; Vargas, F; Santos, MB ; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2004, SOURCE: Proceedings - 10th IEEE International On-Line Testing Symposium, IOLTS 2004 in Proceedings - 10th IEEE International On-Line Testing Symposium, IOLTS 2004
INDEXED IN: Scopus
IN MY: ORCID
74
TITLE: On high-quality, low energy built-in self test preparation at RT-level  Full Text
AUTHORS: Santos, MB ; Teixeira, IC ; Teixeira, JP ; Manich, S; Balado, L; Figueras, J;
PUBLISHED: 2004, SOURCE: 3rd IEEE Latin-American Test Workshop in JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, VOLUME: 20, ISSUE: 4
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
75
TITLE: Overview of the ECAL off-detector electronics of the CMS experiment
AUTHORS: Alemany, R; Almeida, CB ; Almeida, N; Bercher, M; Benetta, R; Bexiga, V; Bourotte, J; Busson, P; Cardoso, N; Cerrutti, M; Dejardin, M; Faure, JL; Gachelin, O; Gastal, M; Geerebaert, Y; Gilly, J; Gras, P; Hansen, M; Husejko, M; Jain, A; Karar, A; Kloukinas, K; Ljuslin, C; Machado, R; Manjavidze, I; Mur, M; Paganini, P; Regnault, N; Santos, M ; Silva, JCD; Teixeira, I ; Teixeira, JP ; Varela, J ; Verrecchia, P; Zlatevski, L; ...More
PUBLISHED: 2004, SOURCE: Nuclear Science Symposium/Medical Imaging Conference in 2004 IEEE Nuclear Science Symposium Conference Record, Vols 1-7, VOLUME: 2
INDEXED IN: Scopus WOS
IN MY: ORCID
76
TITLE: Fault simulation using partially reconfigurable hardware
AUTHORS: Parreira, A; Teixeira, JP ; Pantelimon, A; Santos, MB; de Sousa, JT;
PUBLISHED: 2003, SOURCE: 13th International Conference on Field-Programmable Logic and Applications (FPL 2003) in FIELD-PROGRAMMABLE LOGIC AND APPLICATIONS, PROCEEDINGS, VOLUME: 2778
INDEXED IN: Scopus WOS
IN MY: ORCID
77
TITLE: Design and test of a certifiable ASIC for a safety-critical gas burner control system  Full Text
AUTHORS: Goncalves, FM ; Santos, MB ; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2002, SOURCE: 7th IEEE International On-Line Testing Workshop in JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, VOLUME: 18, ISSUE: 3
INDEXED IN: Scopus WOS CrossRef: 3
IN MY: ORCID
78
TITLE: RTL design validation, DFT and test pattern generation for high defects coverage  Full Text
AUTHORS: Santos, MB ; Goncalves, FM ; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2002, SOURCE: IEEE European Test Workshop (ETW 01) in JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, VOLUME: 18, ISSUE: 2
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
79
TITLE: RTL level preparation of high-quality/low-energy/low-power BIST
AUTHORS: Santos, MB ; Teixeira, IC ; Teixeira, JP ; Manich, S; Rodriguez, R; Figueras, J;
PUBLISHED: 2002, SOURCE: International Test Conference in INTERNATIONAL TEST CONFERENCE 2002, PROCEEDINGS
INDEXED IN: Scopus WOS
IN MY: ORCID
80
TITLE: Implicit functionality and multiple branch coverage (IFMB): a testability metric for RT-Level
AUTHORS: Santos, MB ; Goncalves, FM ; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2001, SOURCE: International Test Conference in INTERNATIONAL TEST CONFERENCE 2001, PROCEEDINGS
INDEXED IN: Scopus WOS
IN MY: ORCID
Página 8 de 11. Total de resultados: 110.

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